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ELECTROMAGNETICCOMPATIBILITYTESTMETHODOFELECTRICALEQUIPMENT
SESE922
PAGE:
PAGE
7
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ISSUEDDATE:1996.05.07
REVISEDDATE:2006.05.02
VERSION:2
SsangyongMotorCompanySMP-13-004(서식5.)
SsangyongMotorCompanySMP-13-004(서식4.)
SES
Ssangyong
Engineering
Standards
ELECTROMAGNETICCOMPATIBILITYTESTMETHODOFELECTRICALEQUIPMENT
SESE922
ISSUED DATE:1996.05.07
REVISED DATE:2006.05.02
VERSION:2
CopyrightSsangyongMotorCompany.Allrightsreserved
PUBLISHEDBYENGINEERINGSTANDARDSECRETARIAT
TECHNICALCENTER
Scope
Thisstandardshallapplytotheelectromagneticcompatibilitytestmethodforeachfunctionalequipmentundertest(hereinafterreferredtoas“EUT”)ofboth12Vand24Vvehicles.
Objective
ThisstandardistoobtaintheelectromagneticqualitybymeasuringandevaluatingtheimmunityandinterferenceoftheECUinorderthattheycanbeoperatedforintendedusewithoutanyperformancedeteriorationintheelectromagneticenvironment.
Definitions
EquipmentUnderTest(EUT):TestSample
EMC(ElectromagneticCompatibility):
Abilityofinstruments,equipmentorsystemsthatcanoperatetosatisfythespecifiedelectromagnetic
environmentwithoutcausinganyunacceptableelectromagneticinterferencetoothertoolsintheir
vicinity.
Abilitythatsignalsandelectromagneticinterferencecancoexistwithoutanylossofdatacontainedinthe
requiredsignals.
EMI(ElectromagneticInterference):
Electromagneticphenomenawheretheperformanceoftheinstruments,equipmentorsystemscouldbe
degradedduetotheelectromagneticinterference.
Note)InEnglish,interferenceanddisturbanceareoftenusedwithoutdistinctionofeachother.
EMS(ElectromagneticSusceptibility):
Degreetowhichtheperformancedegradationofinstruments,equipmentorsystemscanoccurinaplace
wheretheelectromagneticinterferenceexists.
Note)Itindicateshowinsufficienttheimmunityis.
ESD(ElectrostaticDischarge):
Movementofelectricchargethatoccursbetweentheobjectswhenanobjectwithdifferentstaticelectric
potentialapproachesorcontactsanother.
Disturbance:
Electromagneticphenomenathatcouldcausetheperformancedegradationofinstruments,equipmentor
systems,orinadvertentlyaffecttheorganismorinactivesubstances.
Note)Electromagneticnoise,spurioussignalorautonomouschangeinelectromagneticmediacanbea
goodexample.
Immunity:
Abilityofinstruments,equipmentorsystemsthatcanoperatewithoutanyperformancedegradationinan
environmentofelectromagneticinterference.
Radiation:
Emissionofenergyintheformofelectromagneticwavesfromtheenergysourceintospace.
Energythatisemittedortransmittedintheformofelectromagneticwavesthroughspace.
Note)Themeaningof‘ElectromagneticRadiation’isextendedtoincludeinduction.
Emission:
Releaseordischargeofelectromagneticenergyfromawavesource.
ConductedEmission:
Releaseordischargeofelectromagneticenergyalongthepowerorsignallines.
Degradation(ofPerformance):
Outofintendedperformanceofequipmentorsystem
Note)‘Degradation’canbeusedforbothtemporaryandpermanentfailure.
ImmunityLevel:
Maximumlevelofelectromagneticinterferencetowhichinstruments,equipmentorsystemscannormally
operateundertheinfluenceofdisturbance.
NarrowbandEmission:
Emissionwithnarrowerbandwidththanspecificmeasurementinstruments’orreceivers’
BroadbandEmission:
Emissionwithbroaderbandwidththanspecificmeasurementinstruments’orreceivers’
StandingWaveRatio:
Theratiooftheamplitudeofastandingwaveatananti-nodetotheamplitudeatanadjacentnode.
Standingwaveratioinauniformtransmissionline.
Itisshownas.whereΣisreflectioncoefficient.
Note)ItindicatesVSWR(VoltageStandingWaveRatio)unlessotherwisespecified.
GroundPlane:
Conductiveplaneorplatethatiscommonlyusedforcurrentreturnsofthecircuitelementsorsignal
potentials.Sameasgroundreferenceplane.
StripLine:
LongitudinalparalleltransmissionlinedesignedtotransmittheelectromagneticwaveusingTEM
(TransverseElectromagneticMode)thatgeneratesspecificelectromagneticfieldbetweentwoparallel
platesfortest.
TEM(TransverseElectromagnetic)Cell:
Closedsystemthatgeneratesthespecifiedelectricfieldfortestbytransmittingtheelectromagneticwaveof
TEMmodeinarectangularcoaxialcable.
BulkCurrent:Totalofcommoncurrentinaharness
Transient:
Duringashortperiodoftimecomparedtothetimescaleofaninterestingobject,anychangemade
between2continuoussteadystatesoritsrelatedamount,orbothmetionedearlier.
ElectricFieldStrength(E)(Unit:V/m):
Vectorfieldmarkedasinthegivenposition.Itisarithmeticallythesameastheforceappliedtotheunit
positivechargethatisnotinmovementifitislocatedinaplacewithoutmagneticfield.
Note)Ifthemagneticfielddoesn’texist,theforce,isgivenas=Q,andtheelectricfieldstrength
isindicatedintheunitofV/m.
ElectricFieldStrengthLevel:
TheelectricfieldstrengthlevelisrelatedtoE0=1V/m,anddefinedasfollows:
Unit:dB(V/m)
GeneralTestProcedure
EMSTest
ThefollowingspecifiedtestconditionshallbecommonintheEMStest.
TestTemperatureandVoltageSupplied
1)AmbientTemperatureandHumidity:23±5℃,30%~60%
2)VoltageSupplied:13.5V±0.5V(12VSystem),27V±1V(24VSystem)
Modulation
1)CW(ContinuousWave)
2)AMModulation:1KHzSignWaveAmplitudeModulation(AM)80%
3)PulseModulation:t=577s,period=4600s
Thesignalssuppliedshallconformto2004/104/EC(2004)orISO/DIS11452-1(2003).
EUTCondition
1)TheEUTduringthetestshallbeundernormaloperation.
2)TheNormaloperatingconditionshallindicatetheenginerunningunlessotherwisespecified.
FortheEUTfunctioningwiththekeyoff,thetestshallbecarriedouteveninKeyOffmode(battery
powerinputcondition),suchasREKESorRES.
3)TheKeyOffshallindicatethatthekeyisremovedortheIgnition/ACCisoffwiththekeyinserted.
4)TheloadconnectedtoEUTshallbeconnectedtotheactualload,ifpossible.
DwellTime
1)Itshallbelongerthantheminimumtime,‘T’foreachfrequencyandeverysinglecase.
2)Tminimum=2sec
FrequencyStepSize
Modulation
FrequencyBand
MaximumFrequencyStepSize
CW&AM
10kHzto100kHz
100kHzto1MHz
1MHzto10MHz
10MHzto200MHz
200MHzto400MHz
400MHzto1000MHz
10kHz
100kHz
1MHz
5MHz
10MHz
20MHz
CW&PM
800MHzto2GHz
20MHz
ClassificationofVehicleECU(ElectronicControlUnit)
1)ClassA–Equipmentforvehicleconvenience
-Cellularphoneoperation(HandsFreeSet,etc.)
-Convenienceinformationdisplay(Navigation,Clock,DriveInformationController(DIC),etc.)
-TripComputer,MultiStation(MP3,etc.)
-DelayedAccessoryBusOperation(LANController,etc.)
-EntertainmentSystemOperation(CarAudio,Audio/VideoNavigation,DVDPlayer,CarTV,
GPSreceiver,DMB,etc.)
-InteriorLightingOperation
2)ClassB–Equipmenttoimprovefunctionsthatisbasic,notnecessarytovehiclecontrolandoperation.
-ExpressWindowDownOperation(Anti-Trap,etc.)
-Headlamp/KeyWarningOperation
-TirePressureMonitoringSystem(TPMS)
-ElectronicMirrorOperation
-ClimateControl/DisplayOperation
-DoorLock/TrunkReleaseOperation
-HornOperation
-TelltaleDisplayOperation
-RearDefoggerOperation
-KeylessEntryOperation
-Anti-TheftSystemOperation
-AirQualitySystem(AQS)
-DriveSeatSystem
-LDWS(LineDetectorWarningSystem)
-PAS(ParkingAidSystem)
-Telematicsterminal
-Full/SemiAutomaticTemperature(FATC/SATC)
3)ClassC–Equipmentthatarenecessarytovehiclecontrolandoperation,andrelatedtosafety.
-Speed/TachoDisplay
-ControlandDisplay(Airbag,ABS/ESP,Seatbelt,CheckEng.,Brake,OilWarningLamp,etc)
Note)Theaboveequipmentbelongtothetypeofredwarninglightthatisspecifiedinthelawsand
regulationsofEurope,NorthAmerica,AustraliaandSouthKorea.
-ACU(AirbagControlUnit)또는SDM(SensitiveDiagnosticModule)
-SuspensionControl(EAS,etc)
-Brake/TractionControl(ABS/ABD,EPB,etc)
-CruiseControl,FuelControl
-EngineECU(ElectronicControlUnit)
-EMS(EngineManagementSystem)
-ExteriorLightingOperation(HeadlampLevelingSystem,etc)
-PowerSlidingDoorOperation
-PowerSunroofOperation
-PowerWindowOperation
-TCM(TransmissionControlModule)
-SerialDataOperation(ALDL,etc)
-SteeringControl
-WindshieldWipers/Washers/DefrostOperation
-Immobilizer
4)Theclassdivisionmaybedeterminedthroughtheconsultationbetweenthedepartmentsconcerned.
JudgmentCriteriaforVehicleECU(ElectronicControlUnit)Performance
1)RegionⅠ:Everyfunctionshallbeoperatedasdesignedduringandaftertheexposureto
electromagneticinterference.
2)RegionⅡ:Everyfunctionshallbeexecutedasdesignedduringandaftertheexposuretointerference.
Oneormorefunctionsmaybe,however,beyondthespecifiedrange.Aftertheexposure,allfunctions
shallautomaticallyreturntothenormallimitvalue.Thememoryfunctionshallbeinaccordancewiththe
RegionI.
3)RegionⅢ:Allfunctionsshallnotbeoperatedasdesignedduringtheexposuretointerference,
butautomaticallyreturntonormaloperation.
4)RegionⅣ:Allfunctionsshallnotbeoperatedasdesignedduringtheexposuretointerference,
norautomaticallyreturntonormaloperation
Theycanbeinitialized,however,bytheuser'ssimpleoperation.
5)OtheritemsshallconformtoISO/DIS11452-1(2003).TheClassA,B,CandDshallcorrespondtothe
RegionⅠ,Ⅱ,ⅢandIVofthisstandard.
MeasurementDevice:Themeasurementdeviceusedinthetestshallsatisfythedetailsspecifiedin
CISPR16-1-1(2003),CISPR16-1-2(2004),CISPR16-1-3(2003),CISPR16-1-4(2004),
CISPR15-1-5(2003).
EMITest
TestTemperatureandVoltageSupplied
1)TheEUTduringthetestshallbeundernormaloperation.
2)AmbientTemperatureandHumidity:23±5℃,30%~60%
3)VoltageSupplied:13.5V±0.5V(12VSystem),27V±1V(24VSystem)
4)IFBandwidth:120kHz
5)Detector:Peak(Narrowband)&Quasi-Peak(Broadband)
6)Refertothetestmethod,CISPR253rdedition(2005),2005/83/ECforthosenotincludedinthisstandard.
MinimumScanTimeandMeasuringInstrumentBandwidth(6dB)
1)Eitherofthetwomethodsbelowmaybechosendependingonthetypeofmeasurementdeviceintended
foruse.
2)ScanningReceiver(CISPR253rdedition(2005))
Service/FrequencyrangeMHz
Peakdetector
Quasi-peakdetector
Averagedetector
BW
Stepsizea
Dwelltime
BW
Stepsizea
Dwelltime
BW
Stepsizea
Dwelltime
AMbroadcast0.15to30
andmobileservices
9kHz
5kHz
50ms
9kHz
5kHz
1s
9kHz
5kHz
50ms
FMbroadcast76to108
120kHz
50kHz
50ms
120kHz
50kHz
1s
120kHz
50kHz
50ms
Mobileservices30to1000
TVBandⅠ41~88
TVBandⅢ174~230
TVBandⅣ/Ⅴ470~890
DAB174~245
DTTV470~770
120kHz
50kHz
50ms
Dosenotapply
Dosenotapply
Dosenotapply
120kHz
50kHz
5ms
Mobileservice1000to2500
120kHz
50kHz
50ms
Dosenotapply
Dosenotapply
Dosenotapply
120kHz
50kHz
5ms
aForpurelybroadbanddisturbances,themaximumfrequencystepsizemaybeincreaseduptoavaluenotgreater
thantheRBWvalue.
NOTEDwelltimesarerecommendedwhichmightbeoptimized(increasedordecreased)dependingofdisturbance
type(e.g.ignitionnoiseandnetworksignalswithaveragedetectorinAMband).
Note)Thedwelltimeshallbemorethan50msatleast,andmaybeadjustedundertheconsultation
betweenthedepartmentsconcernedifnecessary.
3)SpectrumAnalyzer(CISPR253rdedition(2005))
Service/FrequencyrangeMHz
Peakdetector
Quasi-peakdetector
Averagedetector
RBW
Scantime
RBW
Scantime
RBW
Scantime
AMbroadcast0.15to30
andmobileservice
9kHz
10s/MHz
9kHz
200s/MHz
9kHz
10s/MHz
FMbroadcast76~108
120kHz
100ms/MHz
120kHz
20s/MHz
120kHz
100ms/MHz
Mobileservices30to1000
TVBandⅠ41~88
TVBandⅢ174~230
TVBandⅣ/Ⅴ470~890
DAB174~245
DTTV470~770
120kHz
100ms/MHz
Dosenotapply
Dosenotapply
120kHz
100ms/MHz
Mobileservice1000to2500
120kHz
100ms/MHz
Dosenotapply
Dosenotapply
120kHz
100ms/MHz
ConditionforEUTOperation
1)TheEUTduringthetestshallbeundernormaloperation.
2)TheloadconnectedtoEUTshallbeconnectedtotheactualload,ifpossible.
3)IftheantennaistobeinstalledtoanEUT,itshallbeinstalledinavehicleinsuchwaythatthedistance
betweenthegroundplaneandtheantennafeedpointisatleast15cminapositionsymmetricaltothe
EUTbaseononthecenterlineofthetesttable.TheAntennashallbesecuredtotheinsulation.
MeasurementDevice:Themeasurementdeviceusedinthetestshallsatisfythedetailsspecifiedin
CISPR16-1(2002).
JudgmentCriteriaforRadiated/ConductedDisturbanceConformity
TestMethodforEMS
TestFrequencyRange:10kHz~2GHz
TestSeverityLevels
Thetestseveritylevelmaybechangedthroughtheconsultationbetweenthedepartmentsconcerned,
andadjustedinconnectionwiththeEMSVehicleTargetLevels.
TestMethod
1)Thetestcanbecarriedoutbyselectingoneortwofromthetestmethodsspecifiedin5.4~5.9.
2)Theremaybetheconsultationbetweenthedepartmentsconcernedtoselectthebestpossibletestmethod.
Itisbasedonaprincipletoselectthetestmethodthatcorrespondstotheresultofthevehicletest.
AbsorberLinedChamberMethod
FrequencyRange:10kHz~2GHz
TestSeverityLevels
Class
TestSeverityLevels
JudgmentCriteriaforPerformance
ClassA
40V/m
RegionⅠ
ClassB
60V/m
RegionⅠ
ClassC
80V/m
RegionⅠ
TestMode
Modulation
FrequencyBand
CW&AM
10kHzto1000MHz
CW&PM
800MHzto2000MHz
ThosenotincludedinthisstandardshallbeconformtoISO11452-2(2004),2005/83/EC.
BCI(BulkCurrentInjection)Method
TestFrequencyRange:1MHz~30MHz(DBCI),30MHz~400MHz(CBCI)
TestSeverityLevels
Class
TestSeverityLevels
JudgmentCriteriaforPerformance
ClassA
40mA
RegionⅠ
ClassB
60mA
RegionⅠ
ClassC
80mA
RegionⅠ
PositionofProbeApplied:150mm
ThosenotincludedinthisstandardshallbeconformtoISO11452-4(2005).
StriplineMethod
FrequencyRange:10kHz~200MHz
TestSeverityLevels
Class
TestSeverityLevels
JudgmentCriteriaforPerformance
ClassA
50V/m
RegionⅠ
ClassB
100V/m
RegionⅠ
ClassC
150V/m
RegionⅠ
ThelengthofthestriplineshallconformtoISO11542-5(2002),butthetestmethodforthe800mmstrip
lineshallnotbeallowed.
ThosenotincludedinthisstandardshallbeconformtoISO11452-3(2001).
TEMCellMethod
FrequencyRange:10kHz~200MHz
TestSeverityLevels
Class
TestSeverityLevels
JudgmentCriteriaforPerformance
ClassA
50V/m
RegionⅠ
ClassB
100V/m
RegionⅠ
ClassC
150V/m
RegionⅠ
ThosenotincludedinthisstandardshallbeconformtoISO11452-3(2001).
WidebandTEMCellMethod
FrequencyRange:10kHz~1GHz
TestSeverityLevels
Class
TestSeverityLevels
JudgmentCriteriaforPerformance
ClassA
50V/m
RegionⅠ
ClassB
100V/m
RegionⅠ
ClassC
150V/m
RegionⅠ
ThosenotincludedinthisstandardshallbeconformtoSAEJ111-24(2002).
Tri-PlateLineMethod
FrequencyRange:10kHz~500MHz
341-12-362100TestSeverityLevels
Class
TestSeverityLevels
JudgmentCriteriaforPerformance
ClassA
50V/m
RegionⅠ:
ClassB
100V/m
RegionⅠ
ClassC
150V/m
RegionⅠ
ThosenotincludedinthisstandardshallbeconformtoSAEJ1113-25(2004).
MagneticFieldImmunityMethod
ThepurposeofthistestistotesttheresistanceagainsttheECU(ElectronicControlUnit)and
systemsinstalledinavehicleinthemagneticfieldcreatedbasedonthelowfrequencywave(60Hz&
oddharmonics)aroundhighvoltagepowerlinesandpowerplants
FrequencyRange:60Hz~30kHz
ThistestshallapplyonlytotheECU(ElectronicControlUnit)andsystemsthatmaybemalfunctioned
bytheeffectofthemagneticfield.
TestSeverityLevels
Class
TestSeverityLevels
JudgmentCriteriaforPerformance
ClassA
40T
RegionⅠ
ClassB
60T
RegionⅠ
ClassC
80T
RegionⅠ
ThosenotincludedinthisstandardshallbeconformtoSAEJ1113-22(2004).
TestMethodforEMI
Thetestfrequencyrangesandlimitsmaybechangedthroughconsultationbetweenthedepartments
concerned.
RadiatedEmissionTest
FrequencyRange:150kHz~1GHz
ReferenceLimits:Shallsatisfythetable6.1below.
Frequency
NarrowbandLimit[dBV/m]
BroadbandLimit[dBV/m]
0.15~0.3MHz
45
65
0.53~2.0MHz
35
45
5.9~6.2MHz
35
45
30~70MHz
44-25.13log(freq./30)
54-25.13log(freq./30)
70~108MHz
30
36
108~144MHz
34+15.13log(freq./75)
44+15.13log(freq./75)
144~172MHz
36
44+15.13log(freq./75)
172~314MHz
34+15.13log(freq./75)
44+15.13log(freq./75)
314~316MHz
30
36
316~400MHz
34+15.13log(freq./75)
44+15.13log(freq./75)
400~420MHz
45
55
420~512MHz
36
55
512~820MHz
45
55
820~960MHz
36
55
960~1000MHz
45
55
Table6.1–ReferenceLimits
Theradiatedemissiontestshallsatisfythetable6.1andthevehicletestlimitsshallbesatisfied,and
shallsatisfythelimitthatisdeterminedunderaseparateconsultationfortheradiofrequenciesusedin
thevehicle,suchasTPMS,RKSTICS,ACCandmore.
Note)Theoccurrenceofproblemsthatmightinadvertentlyaffectthevehicleevenwiththeabovelimits
fulfilledrequiresimprovement.
ConductedEmissionTest
FrequencyRange:150kHz~108MHz
PowerInputLineLimits:Shallsatisfythetable6.2below.
Frequency
NarrowbandLimit[dBV]
BroadbandLimit[dBV]
0.15~0.3MHz
60
70
0.53~2.0MHz
45
55
5.9~6.2MHz
45
55
30~54MHz
45
55
70~108MHz
35
40
Table6.2–ReferenceLimits
Control,SignalLineLimits:Shallsatisfythetable6.3below.
Frequency
NarrowbandLimit[dBV]
BroadbandLimit[dBV]
0.15~0.3MHz
70
80
0.53~2.0MHz
50
65
5.9~6.2MHz
45
52
30~54MHz
40
52
70~108MHz
30
36
Table6.3–ReferenceLimits
TestMethodforElectricalDisturbanceByConduction&Coupling
Thisstandardshallapplytothe12Vvehicleandthe24VvehicleshallfollowISO7637-2(2004),ISO7637-3(2003).
VoltageTransientEmissionTest
Thistestisaimedmainlytomeasurethetransientvoltageandcurrentthataregeneratedbyinductive
devices(Motor,Solenoid,Relay,etc.)andshallalsoapplytosub-systemswheresuchECU(Electronic
ControlUnit)areinterconnectedtothewiringharnesses.Besides,Itisaunitleveltestprocedureto
evaluatethevehicleECU(ElectronicControlUnit)forconductedtransientemission(electromagnetic
interference)tothebatteryB+orignitioninputendofatestsample.
TheECU(ElectronicControlUnit)thatcouldbeapotentialcauseofconductedinterferenceshallsatisfythe
itemsofthistest.
TestCondition
1)VoltageSuppliedforTest:Thestandardbatteryforvehiclemaintaining13.0±0.5Vshallbeused.
2)ThetestshallbeperformedusingthegroundplaneandL.I.S.N(LineImpedanceStabilizationNetwork)
andconformtoISO7637-2(2004).
3)Unlessotherwisespecified,theswitchusedinthetestshallhaveresistantloadandbecontinuous
Inaddition,itshallhavehigh-puritysilvercontactwithmorethan30Aofcontactratio,anduseanSPDT
(SinglePoleDoubleThrow)typerelayforvehicle.
4)Thetransientsoccurringintherelaycoilshallnotaffectthoseinthetestsample.
5)Thewiringusedinthetestshallhaveathicknessenoughtomeasurethetransientvoltageandcurrent.
Testmethod
1)Refertotheattachment#9forarrangementofthetestdeviceandthetestsample.
2)Operatetheswitchapproximately10timeswiththetestsampleunderloadbeforethetransient
measurementtest.
3)TurnON/OFForOFF/ONtheswitchforthetransienttestsampletomeasurethetransient.
4)Afteradjustingthetriggerlevelontheoscilloscope,measureandrecordthemaximumnegativeand
positivevoltages.
Thetestconditionsincludingthesamplingtimeusedandprobespecificationshallberecordedindetail.
JudgmentCriteriaforTestResult
Thetransientlevelobtainedfromthetestresultshallbeevaluatedforitsconformityaccordingtothe
table7.1.
Maximumamplitudeoftransient,positivepolarity
+100V
Maximumamplitudeoftransient,negativepolarity
-150V
Table7.1–ReferenceLimits
ElectricalTransientConductionTest
Thistestshallapplytothesupplylines(ACC.,IGN.,B+Lines).However,thepowersupplyvoltage
fluctuationtestshallapplytoB+line.
TestPulses:Testpulse1,2a,2b,3a,3b,4,5aand5bspecifiedinISO7637-2(2004)andpowersupply
voltagefluctuationtest.
TestLevels:Shallsatisfythelevelspecifiedinthetable7.2.
Thepowersupplyvoltagefluctuationtestshallbeinaccordancewithitem7.2.9.
TestPulse
TestlevelUs
Minimum
numberof
pulsesortest
time
Burstcycletime/
pulserepetition
time
JudgmentCriteriaforPerformance
(Region)
Ⅲ
Ⅳ
min.
max.
BeforeTest
AfterTest
1
-75V
-100V
500pulses
0.5s
5s
II
I
2a
+37V
+50V
500pulses
0.2s
5s
II
I
2b
+10V
+10V
10pulses
0.5s
5s
I
I
3a
-112V
-150V
0.5h
90ms
100ms
I
I
3b
+75V
+100V
0.5h
90ms
100ms
II
I
4*(a)
-6V
-7V
5pulse
1)
1)
III2)
I
5a
65V
+87V
5pulse
1)
1)
II
I
5b
+40V
+40V
5pulse
1)
1)
II
I
1)Sincetheminimumnumberoftestpulseis1,thepulsecycletimeisnotgiven.However,atleast
1-minutedelaytimeshallbegivenbetweenthepulseswhenalargenumberofpulsesareapplied.
2)ThememoryfunctionshallbeinaccordancewiththeRegionI.
*(a):Ub=12V,Vs=-7V,Va=-5.5V,t8=10sec,tf=5ms&100ms
Table7.2–12VSystemRequirements
Basically,thetestLevelIVshallapplytoalltheECU(ElectronicControlUnit),andifnecessary,
thetestlevelIIImaybeusedundertheconsultationbetweenthedepartmentsconcerned.
Thistestmayapplytothelinesinwhichtheelectricaltransientconductioncouldbegenerated,
eventhoughtheyarenotthesupplylines.
ThosenotincludedinthisstandardshallbeconformtoISO7637-2(2004).
TestPulse
1)Testpulse1
UA=13.5V
UA=27V
Ri=10Ω
Ri=50Ω
td=2ms
td=1ms
tr=1s
tr=3s
t1=5s
t2=200ms
t3=100s
2)Testpulse2a
UA=13.5V
UA=27V
Ri=2Ω
td=0.05ms
tr=1s
t1=5s
3)Testpulse2b
UA=13.5V
UA=27V
Ri=0.05Ω
td=200ms
tr=1ms
t6=1ms
t12=1ms
4)Testpulse3a
UA=13.5V
UA=27V
Ri=50Ω
td=0.1s
tr=5ns
t1=100s
t4=10ms
5)Testpulse3b
UA=13.5V
UA=27V
Ri=50Ω
td=0.1s
tr=5ns
t1=100s
t4=10ms
t5=90ms
6)Testpulse4
UB=12V
UB=24V
US=-7V
US=-16V
UA=-5.5V
UA=-7V
Ri=0.02Ω
t7=40ms
t7=100ms
t8=50ms
t9=20s
t10=5ms
t10=10ms
t11=100ms
7)Testpulse5a
UA=13.5V
UA=27V
Ri=2Ω,4ΩNote1)
Ri=8Ω
td=200ms,400ms
tr=10ms
Note2)
Note1)Fortestpulse5a,thetestshallbeperformedat2Ω/200msand4Ω/400ms.
Note2)Testpulse5ashallapplyonlytothevehicleswheretheCLD(CentralLoadDump)diodeisnot
applietothealternator.
8)Testpulse5b
UA=13.5V
UA=27V
US*=40V
US*=87V
Ri=2Ω
Ri=6Ω
td=40ms
tr=10ms
Note3)
Note3)Testpulse5bshallapplyonlytothevehicleswheretheCLD(CentralLoadDump)diodeis
appliedtothealternator.
PowerSupplyVoltageFluctuationTest
NumberofVoltageApplied:20Cycles
Targetfor:Micom-appliedECU(ElectronicControlUnit)
JudgmentCriteriaforPerformance:Itshallnormallyoperateduringandafterthetest.
ElectricalTransientTransmissionTest–Capacitive&InductiveCoupling
Thistestshallapplytootherthanthesupplylines.
TestPulses:ISO7637Part3TestPulseA,B
TestLevels:ShallsatisfythelevelIVspecifiedin7.2.
TestPulse
TestlevelUs
Minimumnumberofpulsesortesttime
Burstcycletime
ClassA,B,C
Ⅳ
min.
max.
A
-60V(RegionⅠ)
10min
90ms
110ms
B
+40V(RegionⅠ)
10min
90ms
110ms
Table7.4–12VSystemRequirements
LevelⅢmayapplythroughtheconsultationbetweenthedepartmentsconcerned.
TestMethodforElectrostaticDischarges
ThosenotincludedinthisstandardshallbeconformtoISO10605(2001).
NonOperatingModeTest
EUTCondition:Notconnectedtothepowerandtheconnector.
DischargePoints:Allaccessiblelocations(Body,ConnectorPin,etc)
Thedischargepointcanbeselectedatthetester’sdiscretion.
DischargeMode:AirDischarge
ESDCharacteristics:150pF±10%,2000Ω±10%
TestSeverityLevels:±10kV
TestTimes:Atleast5timesforeachpointandpolarity.
DischargeDelayTime:Morethan5secondsofdelaytimebetweendischarges.
JudgmentCriteriaforPerformance:RegionⅠbeforeandafterthetest.
OperatingModeTest
EUTCondition:Normallyoperatingwiththepower(battery)andtheconnectorconnected.
DischargePoints:Allaccessiblelocations(Body,ConnectorPin,etc)
Thedischargepointcanbeselectedatthetester’sdiscretion.
ESDCharacteristics:330pF±10%,2000Ω±10%
DischargeMode&TestSeverityLevels:TestLevelcanbechangedthroughtheconsultationbetween
thedepartmentsconcerned.
NotethatthetestshallsatisfythelevelsspecifiedinISO10605.
DirectDischarge
TestSeverityLevels
FunctionalClass
ClassA
ClassB
ClassC
±8kV
REGIONⅡ
REGIONⅡ
REGIONⅡ
±6kV
REGIONⅡ
REGIONⅡ
REGIONⅡ
±4kV
REGIONⅠ
REGIONⅠ
REGIONⅠ
AirDischarge
TestSeverityLevels
FunctionalClass
ClassA
ClassB
ClassC
±15kV
REGIONⅢ
REGIONⅢ
REGIONⅢ
±10kV
REGIONⅡ
REGIONⅡ
REGIONⅡ
±4kV
REGIONⅠ
REGIONⅠ
REGIONⅠ
TestTimes:Atleast5timesforeachpointandpolarity.
DischargeDelayTime:Morethan5secondsofdelaytimebetweendischarges.
NumberofSample
Unlessotherwisespecified,thenumberofsampleshallbe,inprinciple,morethan3samples.Thetestsampleforeachtestitemshallbebasedonmorethan3samples.
StorageofSample
Thesampleusedinthetestshallbekept,inprinciple,bythedepartmentinchargeofthesampletest.IfthetesthasbeencarriedoutbyanSMC-authorizedexternaltestinstitute,thesampleusedinthetestshallbesubmittedwiththetestresults,measurementdeviceusedandinspection/correctionresultsafterthecompletionofthecorrespondingtest.Whenthereisarequestfromthedepartmentconcerned,however,storingandreturningthesamples(except1samplefortestconfirmation)maybesubjecttotheconsultationbetweenthedepartments
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