常见可靠性与环境试验

1、可靠性与环境试验之元器件筛选常见设计及参数电容器高温老炼检测系统Capacitor High Temperature Burn-In Test System型号：SPCP-T温度范围：环境温度+150C老炼区及试验通道：4个实验区、16个试验通道试验工位：640个老炼试验电源：4台，可扩展为16台，输出100V、300V、600V、1000V等规格电压：0V1000VSpecification: SPCP-TTemperature Range: RT 150CBurn-In Area and Test Channels: 4 test areas, 16 test channelsTest S

2、tation: 640Power Supply: 4, can be expanded to 16, the output of100V, 300V, 600V, 1000V and other specificationsVoltage: 0V 1000V集成电路高温动态老炼系统IC High Temperature Dynamic Burn-In System型号：SPIC-T温度范围：环境温度+150C老炼区及试验通道：整机设置16个区域，每个区域对应一个老炼试验通道试验工位：提供16板X208位/板=3328个试验工位驱动控制板：16块、64路数字信号、4路模拟信号、4路程控二级试验电

3、源Specification： SPIC-TTemperature Range: RT 150CBurn-In Area and Test Channels: 16 test areas, one test areascorresponds to one test channelTest Station: 16 (panels) X 208 (bit per panel ) =3328 test stationsDrive Control Panels : 16 panels , 64 digital signal, 4 analog signal, 4 secondary distance

4、control test power supplies高温反偏老炼检测系统High Temperature Anti Burn-In Test System型号:SPFP-T温度范围:环境温度+150C老炼区及试验通道:12通道试验工位:整机同时可插12块试验板，总计74个/块X12块=888个检测试验工位（单电源），20个/块X12块=240个检测试验工位（单电源）老炼试验电源:3台，可扩展为10台检测控制板:12块，老炼电压检测范围0V1500V漏电流检测范围：100nA50mASpecification: SPFP-TTemperature Range: RT+150CBurn-In A

5、rea and Test Channels: 12 test channelsTest Station: 12 panels,74( bit per panel )X12 (panel)=888 test stations (single power supply ),20( bit per panel n) X12 (panel)=240 test stations (single power supply)Power Supply: 3, can be expanded to 10Drive Control Panels: 12Voltage: 01500VLeakage Current:

6、 100nA50mA拥有电容器高温老炼检测系统、集成电路高温动态老炼系统、高 温反偏老炼检测系统、晶体管特性图示仪、大功率数字存储图示仪、 数字电桥、正向压降测试仪、漏电流测试仪、直流低阻测试仪等试验 设备和测试仪器，可开展电阻、电容、电感、半导体分立器件等元器 件的老炼筛选和性能测试，能够满足GJB、AEC和MIL-STD等系列标准 的要求，广电计量可靠性与环境试验拥有上述设备及能力。GERTC has high temperature burn-in system for capacitor, high temperature dynamic burn-in system and high

7、 temperature reverse bias burn-in system for integrated circuit, transistor characteristics curve tracer, high power digital storage curve tracer, digital electric bridge, forward voltage drop tester, leaking current tester, DC low resistance tester, etc, with which we can carry out burn-in screening and performance test for resistor, capacitor, inductors,semiconduct