透射电子学中的一些术语的翻译

1、透射电子学中的一些术语的翻译ACF absorption correction factor 吸收校正因子A/D analog to digital (converter)模 拟数字化ADF annular dark field 环形暗场AEM analytical electron microscope/microscopy 分析电子显微镜/学AES Auger electron spectrometer/spectroscopy 俄歇电子光谱仪/学AFF aberration-free focus 无像差焦点ALCHEMI atom location by channeling-enhan

2、ced microanalysis APB anti-phase domain boundary 反相畴界ATW atmospheric thin window BF bright field 明场BFP back focal plane 后焦面BSE backscattered electron 背散射电子BSED backscattered-electron diffraction 背散射电子衍射 BZB Brillouin-zone boundaryC(1,2,etc.)condenser (l, 2, etc.) lens第 1， 2.聚光镜 CB coherent bremsstra

3、hlungCBED convergent-beam electron diffraction 会聚束电子衍射CBIM convergent-beam imaging 会聚束成像CCD charge-coupled device 电荷耦合装置CCF cross-correlation function 互相关函数CCM charge-collection microscopy CDF centered dark field 中心暗场像CF coherent Fennel/FoucaultCFEG cold field-emission gun 冷场发射枪CL cathodeluminescenc

4、e 阴极发光CRT cathode-ray tube 阴极射线管CS crystallographic shear 晶体学切变CSL coincident-site lattice DF dark field 日音场DOS density of states 态密度DP diffraction pattern 衍射花样DQE detection of quantum efficiency 量子探测效率DSTEM dedicated scanning transmission electron microscope 专业扫 描透射 电子显 微 镜 DTSA desktop spectrum an

5、alyzerEBIC electron beam-induced current/conductivity EELS electron energy-loss spectrometry 电子能 量损失谱EFI energy-filtered imaging 能量过滤成像ELNES energy-loss near-edge structure 能量损失近边结构 ELP energy-loss program (Gatan)EMMA electron microscope microanalyzerEMS electron microscopy image simulation 电子显微学图像模

6、拟EPMA electron probe microanalyzerESCA electron spectroscopy for chemical analysis ESI electron spectroscopic imagingEXAFS extended X-ray absorption fine structure扩展 X 射线吸收精细结构EXELFS extended energy-loss fine structure 扩展能量损失精细结构FCF fluorescence correction factor 荧光校正因子FEG field-emission gun 场发射枪FET

7、 field-effect transistor 场效晶体管FFT fast Fourier transform 快速傅立叶变换FOLZ first-order Laue zone 一阶劳埃区FSE fast secondary electronFTP file transfer protocol 文件传输协议FWHM full width at half maximum半极大处全宽度半峰全宽FWTM full width at tenth maximum GB grain boundary 晶界GCS generalized cross sectionGIF Gatan image filt

8、er Gantan 图像过滤GOS generalued oscillator strengthHAADF high-angle annular dark field 高角环形暗场HOLZ higher-order Laue zone 高阶劳埃区HPGe high-purity germanium 高纯 GeHRTEM high-resolution transmission electron microscope/microscopy高分辨透射电子显微镜 / 学HV high vacuum 高真空HVEM high voltage electron microscope/microscopy

9、 高压电子显微镜/学IDB inversion domain boundary 反相畴界IEEE International Electronics and Electrical Engineering IG intrinsic GeIVEM intermediate voltage electron microscope/microscopy 中等电压电子显微镜/学K-M Kossel-MollenstedtLEED low-energy electron diffraction 低能电子衍射LLS linear least-squares 线性最小二乘LUT look-up table 对

10、照表MC minimum contrast 最小衬度MCA multichannel analyzer 脉冲高度分析仪MDM minimum detectable mass MLS multiple least-squares MMF minimum mass fractionMSDS material safety data sheetsNCEMSS National Center for Electron Microscopy simulation system NIH National Institutes of He althNIST National Institute of Sta

11、ndards and Technology OR orientation relationshipOTEDP oblique-textured electron diffraction pattern PB phase boundary相界P/B peak-to-background ratio 峰背比PEELS parallel electron energy-loss spectrometer/spectroscopy 并联电子能量损失谱仪/学PIMS Precision Ion-Milling System PIPS Precision Ion-Polishing System PM p

12、hotomultiplier 光 电 倍增器POA phase-object approximation 相位物近似QHRTEM quantitative high-resolution transmission electron microsc.定 量高分辨透射电子显微 学RB translation boundary (yes, it does!) RCP rocking-beam channeling patterns RDF radial distribut ion functionREM reflection electron microscope/microscopy 反射电子显微

13、镜/学RHEED reflection high-energy electron diffraction 反射高能电子衍射RHF relativistic Hartree-FockRHFS relativistic Hartree-Fock-Slater SAD selected-area diffraction 选区衍射SE secondary electron 二次电子SEELS serial electron energy-loss spectrometer/spectrometry 串联电子能量损失谱仪/学SEM scanning electron microscope/microsc

14、opy 扫描电子显微镜/ 学 SF stacking fault 堆垛层错SHRLI simulated high-resolution lattice images 程序的名称SIMS secondary ion mass spectrometry S/N signal-to-noise ratio 信噪比SOLZ second-order Laue zone 二阶劳埃区SRM standard reference materialSTEM scanning transmission electron microscope/microscopy 扫描透射电子显微镜/学STM scanning

15、 tunneling microscope/microscopy 扫描隧道电子显微镜/学TB twin boundary 挛晶界TEM transmission electron microscope/microscopy 透射电子显微镜/学TMBA too many bloody acronyms UHV ultrahigh vacuum 超高真空UTW ultra thin window 超薄窗口V/F voltage to frequency (converter)VLM visible-light microscope/microscopy WB weak beam 弱束WBDF we

16、ak-beam dark field 弱束暗场WDS wavelength-dispersive WP whole pattern 全图WPOA weak-phase object approximation 弱相位物近似XANES X-ray absorption near-edge structure X 射线吸收近边结构XEDS X-ray energy-dispersive spectrometer X 射线能量色散谱仪XRD X-ray diffraction X 射线衍射YBCO yttrium-barium-copper oxide 钇钡铜氧YAG yttrium-aluminu

17、m garnet 钇铝石榴石ZAF atomic number, absorption, fluorescence correction ZAP zone-axis patternZOLZ zero-order Laue zone 零阶劳埃区ALCHEMI atom location by channeling-enhanced microanalysis 原子位置通道增强微分析ATW atmospheric thin window对应于超薄窗，大概是常压薄窗BZB Brillouin-zone boundary 布里渊区界CB coherent bremsstrahlung 相干韧致辐射EB

18、IC electron beam-induced current/conductivity 应该是电子束诱导电流/ 导电性ELP energy-loss program (Gatan)能量损失程序(Gatan 公司)EMMA electron microscope microanalyzer 电子显微微分析仪EPMA electron probe microanalyzer 电子探针微分析仪ESCA electron spectroscopy for chemical analysis化学分析的电子能谱(也就是常见的XPS仪)ESI electron spectroscopic imaging

19、 电子谱成像FSE fast secondary electron 不知道：快速二次电子？FWTM full width at tenth maximum 半高宽吧IEEE International Electronics and Electrical Engineering 著名学会：国际电子和电气工程IG intrinsic Ge只知道intrinsic是内能K-M Kossel-Mollenstedt会聚束衍射的一种花样？MDM minimum detectable mass 最小探测量？MMF minimum mass fraction 最小质量分数？MSDS material safety data sheets 材料安全数据表NCEMSS National Center for Electron Microscopy simulation system 电子显微学模拟系统国家 中心NIH National Institutes of Health美国国家健康研究所NIST National Institute of Standards and Technology 美国国家标准和技术研究所OR orientation relationship 人际导向？猜的OTEDP ob