SS-00259-2013(第12版-中英文版) SONY零部件和材料中的环境管理物质 管理规定

SS-00259forGeneralUse,TwelfthEditionSONYSS-00259(12thEdition)forGeneralUseandretrievalsystem,withouCopyright2013SonyCorpCONTENTS 1 1 1 1 2CONTROLLED" 34.1"Environment-relatedSubstancestobeContr 34.2Additionalrulesforpackaging 4.3Additionalrulesforbatteries(Applicable 20 APPENDIX................................................................................SS-00259(12thEdition)forGeneralUseWithregardtothe"Environment-relatedSubstancestobeControlled('ControlledSubstances')"containedinthepartsanddevicesemployedinSonyelectronicsproducts,thisStandardclarifies(1)bannedsubstances,(2)substancestobephasedout,and(3)exemptedsubstancesandtheiruses,inordertorealizethefollowingaimsandobjectives:1)Topreventtheabove-mentionedsubstancesfrombeingusedforSonyelectronicsproducts;2)Tocomplywithrelatedlawsandregulations;3)Toreducetheinfluenceoftheabovesubstancesupontheecosystem;and4)Tocontributetothepreservationoftheglobalenvironment.2.1ScopeapplicabletopartsandmaterialsTargetsaretheparts,materials,andotherarticlesthatareprocuredbytheSonygroup,orbythirdpartiestowhichtheSonygroupoutsourcesthedesignandmanufactureofitselectronicsproducts.Thetargetsneedtosatisfythecriteria/thresholdlevelsspecifiedinthisStandard.Targetpartsandmaterials:-Semi-finishedproducts(e.g.modules,functionalunits,boardassemblies,andotherassemblyparts)-Parts(electricalparts,mechanicalparts,semiconductordevices,PWBs,recordingmedia,andpackagingcomponentsandmaterials)-Screws-Accessories(mice,remotecommanders,ACadaptors,andotheraccessorieswithwhichyoucanuseproducts)-Materialsconstitutingsubsidiarypartsandmaterials(e.g.adhesives,adhesivetapes,solderingmaterials,etc.)usedforproducts-Printedmaterials(e.g.instructionmanuals,warrantycards,additionalproduct/partsinformation)-Repairparts(Theapplicationofsomerepairpartsforproductsonthemarketshallbefollowedtheinstructionsontheseparatelyissuednotice.)-Packagingcomponentsandmaterialsthatpartssuppliersusefordeliveryandprotection(SeeSection4.2.1"Definitionofpackagingcomponentsandmaterials"fordetails.)-Batteries2.2Scopeapplicabletoproducts1)SonyelectronicsproductsthataredesignedandmanufacturedbytheSonygroupforsale,loan,ordistribution2)SonyelectronicsproductsbeingsoldandloanedordistributedwiththeSonygroup'slogosonthem,whosedesignand/ormanufactureareoutsourcedtothirdparties3)Thirdparties'electronicsproductswhosedesignand/ormanufactureareoutsourcedtotheSonygroup(exceptwhenthepartsandmaterialsarespecifiedbythethirdparties)Regardingtheuseofsubstancesprohibitedorrestrictedbyregionalorcountrylawsandordinances,thelawsandordinancesmustbeobservedandfollowedeventhoughthesubstancesandtheirusesarenotclearlyregulatedinthisStandard.Copyright2013SonyCorpSS-00259(12thEdition)forGeneralUseInthisStandard,termsaredefinedinthefollowingmanners.1)"Environment-relatedSubstancestobeControlled('ControlledSubstances')"Amongthesubstancescontainedinpartsanddevices,"Environment-relatedSubstancestobeControlled('ControlledSubstances')"arethosewhich,accordingtoSony'sjudgment,havesignificantenvironmental-impactonbothhumansandtheglobalenvironment.2)ManagementlevelsTomanagetheabove-mentionedsubstances,thefollowingLevelsandExemptionareused:a)Level1ThesubstancesandtheirapplicationsclassifiedintothisLevelarethosethatarebannedfortheuseinpartsandmaterials.b)Level2Onthedatesetineachtable,thesubstancesandtheirapplicationsintherespectivetablesshallbereclassifiedintoLevel1.c)Level3Consideringpossibilityofphase-outinthefuture(i.e.reclassificationintoLevel2),technicalinvestigationsonsubstancesandtheirapplicationsareconducted.d)Exemption3)Contained"Contained"meansthatasubstanceremainsinparts,devices,ortheirmaterialsbecauseofaddition,filling,blending,oradhesion,whetherintendedornot.Whenasubstanceisunintentionallycontainedin,oraddedtoaproductinaprocessingprocess,thissituationisalsoregardedas"Contained."4)Intentionallyadded"Intentionallyadded"meansasituationwhereasubstanceiscontainedinthepart,device,oritsmaterialsbecauseofdeliberateaddition,filling,blending,oradhesion,inordertoprovideaspecificcharacteristic,appearance,property,attributeorquality.Notes:*Asubstancethatsatisfieseitherorbothofthefollowingconditionsistreatedasimpurityandnot"Intentionallyadded":a)Onecontainedinanaturalmaterial,whichcannotbecompletelyremovedinarefiningprocessbyadequatetechnicalmeans(i.e.naturalimpurities);andb)Onegeneratedinasynthesisprocess,whichcannotbecompletelyremovedbyadequatetechnicalmeans.*Therearesubstancescalled"impurities,"thenameofwhichisusedtodistinguishthemfrommainmaterials.Iftheyareusedforthepurposeofchangingthecharacteristicsofamaterialsuchasalloyandplastic,theyaretreatedas"Intentionallyadded."*Dopants(DopingAgents)forproductionofsemiconductordevices,etc.arenottreatedas"Intentionallyadded"ifpresentinthedevicesinaverysmallamount.5)Target"Target"isanobjectorelement(e.g.parts,materials,applicationsorprocessing)thatmighttriggerfurtherobligationsdependingonthedefined“managementlevel.”6)Criteria/thresholdlevel"Criteria/thresholdlevel"isaconditionoranumericalvalue.Theuseofacontrolledsubstanceisprohibited(level1)orwillbeprohibitedinthefuture(level2&3)ifa)thatcontrolledsubstancefulfillstheconditionorb)theconcentrationofthecontrolledsubstancematchesorexceedsthespecifiednumericalvalueNotes:*Whencriteriasuchas'Intentionallyadded'andanumericalvalueareshownin'Criteria/thresholdlevels',bothofthemshallbesatisfied.7)EffectivedateofthebanonthedeliveryThisindicatesthedateonorafterwhichSonywon'tacceptthepartsand/ormaterialsspecifiedinthecorrespondingcolumnsofTable4.2.8)PlasticsdefinedinthisStandardMorespecifically,"plastics"mainlymeanthefollowingarticlescomposedofsynthetichigh-molecularpolymers:resins,films,adhesives,adhesivetapes,moldedproducts,productsmadeofsyntheticrubber,andplasticsmadefromrawmaterialsofplantorigin.Note:*Whenanaturalresinissynthesizedwithanyoneoftheabovearticles,thesyntheticsubstanceisaplastic.Copyright2013SonyCorpSS-00259(12thEdition)forGeneralUse4.1"Environment-relatedSubstancestobeControlled('ControlledSubstances')"Thetablebelowliststhe"Environment-relatedSubstancestobeControlled('ControlledSubstances'),"definedinthisStandard.Table4.1Listof"Environment-relatedSubstancestobeControlled('ControlledSubstances')"SubstancesCadmiumandcadmiumcompoundsLeadandleadcompoundsMercuryandmercurycompoundsHexavalentchromiumcompoundsPolychlorinatedbiphenyls(PCB),Polychlorinatednaphthalenes(PCN),Polychlorinatedterphenyls(PCT)Short-chainchlorinatedparaffins(SCCP)Polyvinylchloride(PVC)andPVCblendsTris(2-chloroethyl)phosphate(TCEP)OtherchlorinatedorganiccompoundsPolybrominatedbiphenyls(PBB)Polybrominateddiphenylethers(PBDE)(includingdecabromodiphenylether[DecaBDE])Hexabromocyclododecane(HBCDD)OtherbrominatedorganiccompoundsTrisubstitutedorganotincompounds(includingtributyltin(TBT)compoundsandtriphenyltin(TPT)compounds)Dibutyltin(DBT)compoundsDioctyltin(DOT)compoundsAsbestosSpecificazocompoundsFormaldehydeSpecificbenzotriazoleDimethylfumarate(DMF)BerylliumoxideBerylliumcopperCobaltdichlorideDiarsenictrioxide,DiarsenicpentaoxideBis(2-ethylhexyl)phthalate,Dibutylphthalate,Benzylbutylphthalate,DiisobutylphthalateDi-isononylphthalate,Di-isodecylphthalate,Di-n-octylphthalate,Di-n-hexylphthalate,"1,2-Benzenedicarboxylicacid,di-C6-8-branchedalkylesters,C7-rich","1,2-Benzenedicarboxylicacid,di-C7-11-branchedandlinearalkylesters",Bis(2-methoxyethyl)phthalate,Diisopentylphthalate,"1,2-Benzenedicarboxylicacid,dipentylester,branchedandlinear",N-pentyl-isopentylphthalateHydrofluorocarbon(HFC),Perfluorocarbon(PFC)Ozonedepletingsubstances(ODS)Perfluorooctanesulfonates(PFOS)Boricacid,specificsodiumborates4-(1,1,3,3-tetramethylbutyl)phenolBis(2-methoxyethyl)etherN,N-dimethylacetamide(DMAC)Ethyleneglycoldimethylether(EGDME)PerchloratesCopyright2013SonyCorpSS-00259(12thEdition)forGeneralUseTable4.2Main"Targets"and"Effectivedateofthebanonthedelivery"regarding'ControlledSubstances'Substances:CadmiumandcadmiumcompoundsTargetsCriteria/thresholdlevelsEffectivedateofthebanonthedeliveryLevel1-Plastics(includingrubbers)-PaintsNote:Insulationofwires,cablesandcordsaredefinedasplastics(includingrubbers).-100ppm(or0.01wt%)ormoreofthecadmiuminhomogeneousmaterials(*)Banned-Solders-Morethan20ppm(or0.002wt%)ofthecadmiuminsolder-Allapplicationsotherthantheabove(See4.2Additionalrulesforpackagingcomponentsandmaterials.See4.3Additionalrulesforbatteries.)-100ppm(or0.01wt%)ormoreofthecadmiuminhomogeneousmaterialsLevel2-CadmiumincolourconvertingII-VILEDs(<10µgCdpermm2oflight-emittingarea)foruseindisplaysystems,exceptthecaseswherecadmiumiscontainedinaconcentration≥100ppminthefollowingdesignatedplastics:Designatedplastics:polymersorcopolymersofvinylchloride(PVC),polyurethane(PUR),"low-densitypolyethylene(LDPE),withtheexceptionoflow-densitypolyethyleneusedfortheproductionofcolouredmasterbatch",celluloseacetate(CA),celluloseacetatebutyrate(CAB),epoxyresins,melamine-formaldehyde(MF)resins,urea-formaldehyde(UF)resins,unsaturatedpolyesters(UP),polyethyleneterephthalate(PET),polybutyleneterephthalate(PBT),transparent/general-purposepolystyrene,acrylonitrilemethylmethacrylate(AMMA),cross-linkedpolyethylene(VPE),high-impactpolystyrene,polypropylene(PP)Note:Level1appliestothecaseswherecadmiumiscontainedinaconcentration≥100ppmintheabovedesignatedplasticsApril1,2014Exemption-CadmiumanditscompoundsinelectricalcontactsNote:applicabletoplatingsusedforelectricalcontactsthatrequirehighreliabilityandhavenoalternativematerials-CadmiuminfilterglassesN/A(*)Plastics(includingrubbers),paints,andinksarerequiredtobetestedinaccordancewiththefollowingstandards.Standardsformeasurement1)SamplepreparationTypicalsamplepreparationmethods:e.g.IEC62321:2008,EPA3052:1996(1)Closedsystemforaciddecompositionmethod(e.g.microwavedecompositionmethod)(2)Aciddigestionmethod(3)DryashingmethodNote:Precipitatesmustbecompletelydissolvedbysometechnicalmeans(e.g.alkalifusion).Anyextractionmethods(includingEN71-3:1994,ASTMF963-96a,ASTMF963-03,ASTMD5517,andISO8124-3:1997)shallnotbeapplied.2)MeasurementmethodsTypicalmeasurementmethods:e.g.IEC62321:2008(1)InductivelyCoupledPlasma-Optical(Atomic)EmissionSpectroscopy(ICP-OES[ICP-AES])(2)AtomicAbsorptionSpectroscopy(AAS)(3)InductivelyCoupledPlasma-MassSpectroscopy(ICP-MS)Note:Ifacombinationofasamplepreparationmethodandameasurementmethodcanensurethatthelimitofquantificationforcadmiumislessthan5ppm,thecombinationisapplicable.Copyright2013SonyCorpSS-00259(12thEdition)forGeneralUseSubstances:LeadandleadcompoundsTargetsCriteria/thresholdlevelsEffectivedateofthebanonthedeliveryLevel1-Plastics(includingrubbers)-PaintsNote:Insulationofwires,cablesandcordsaredefinedasplastics(includingrubbers).-Morethan100ppm(or0.01wt%)oftheleadinhomogeneousmaterials(*)Banned-Allapplicationsotherthantheabove(See4.2Additionalrulesforpackagingcomponentsandmaterials.See4.3Additionalrulesforbatteries.)-1000ppm(or0.1wt%)ormoreoftheleadinhomogeneousmaterialsExemption-Leadinglassofcathoderaytubes-Leadinglassoffluorescenttubesnotexceeding0.2%byweight-Leadasanalloyingelementinsteelformachiningpurposesandingalvanisedsteelcontainingupto0.35%leadbyweight-Leadasanalloyingelementinaluminiumcontainingupto0.4%leadbyweight-Copperalloycontainingupto4%leadbyweight-Leadinhighmeltingtemperaturetypesolders(i.e.leadbasedalloyscontaining85wt%byweightormorelead)-Electricalandelectroniccomponentscontainingleadinaglassorceramicotherthandielectricceramicincapacitors,e.g.piezoelectronicdevices,orinaglassorceramicmatrixcompound-Leadindielectricceramicincapacitorsforaratedvoltageof125VACor250VDCorhigher-LeadinPZTbaseddielectricceramicmaterialsforcapacitorswhicharepartofintegratedcircuitsordiscretesemiconductors-Leadinwhiteglassesusedforopticalapplications-Leadinfilterglasses-LeadinsoldertocompleteaviableelectricalconnectionbetweensemiconductordieandcarrierwithinintegratedcircuitflipchippackagesNote:TheitemcoverssolderpastesusedunderC4(ControlledCollapseChipConnection)bumps.-Leadincermet-basedtrimmerpotentiometerelementsN/A(*)Plastics(includingrubbers),paints,andinksarerequiredtobetestedinaccordancewiththefollowingstandardsStandardsformeasurement1)SamplepreparationTypicalsamplepreparationmethods:e.g.IEC62321:2008,EPA3052:1996(1)Closedsystemforaciddecompositionmethod(e.g.microwavedecompositionmethod)(2)Aciddigestionmethod(3)DryashingmethodNote:Precipitatesmustbecompletelydissolvedbysometechnicalmeans(e.g.alkalifusion).Anyextractionmethods(includingEN71-3:1994,ASTMF963-96a,ASTMF963-03,ASTMD5517,andISO8124-3:1997)shallnotbeapplied.Additionally,EN1122:2001isnotapplicableforlead.2)MeasurementmethodsTypicalmeasurementmethods:e.g.IEC62321:2008(1)InductivelyCoupledPlasma-Optical(Atomic)EmissionSpectroscopy(ICP-OES[ICP-AES])(2)AtomicAbsorptionSpectroscopy(AAS)(3)InductivelyCoupledPlasma-MassSpectroscopy(ICP-MS)Note:Ifacombinationofasamplepreparationmethodandameasurementmethodcanensurethatthelimitofquantificationforleadislessthan30ppm,thecombinationisapplicable.*Table4.2a"Allowableleadconcentrations"isdeletedsinceitscontentwasincorporatedintoExemption.Copyright2013SonyCorpSS-00259(12thEdition)forGeneralUseSubstances:MercuryandmercurycompoundsTargetsCriteria/thresholdlevels(*)EffectivedateofthebanonthedeliveryLevel1-Allapplications(See4.2Additionalrulesforpackagingcomponentsandmaterials.See4.3Additionalrulesforbatteries.)-Intentionallyadded-1000ppm(or0.1wt%)ormoreofthemercuryinthehomogeneousmaterialsBannedExemption-Mercuryincoldcathodefluorescentlamps(CCFL)andexternalelectrodefluorescentlamps(EEFL):Shortlength(notover500mm):Notexceeding3.5mgofmercuryperlampMediumlength(over500mmandnotover1500mm):Notexceeding5mgofmercuryperlampLonglength(over1500mm):Notexceeding10mgofmercuryperlamp-Mercuryinhigh-pressuregasdischargelamps(e.g.projectorlamps)N/A*When"Intentionallyadded"andanumericalvalueareshownin"Criteria/thresholdlevels",bothofthemshallbesatisfied.Substances:HexavalentchromiumcompoundsTargetsCriteria/thresholdlevels(*)EffectivedateofthebanonthedeliveryLevel1-Surfacesofscrews,steelsheets,etc.thatareprocessedwithplatingorconversioncoating-Residueontheprocessedsurface(**)Banned-Allapplicationsotherthantheabove(See4.2Additionalrulesforpackagingcomponentsandmaterials.See4.3Additionalrulesforbatteries.)-Intentionallyadded-1000ppm(or0.1wt%)ormoreofthehexavalentchromiuminthehomogeneousmaterials*When"Intentionallyadded"andanumericalvalueareshownin"Criteria/thresholdlevels",bothofthemshallbesatisfied.**ResidueontheprocessedsurfaceisbannedinLevel1.Notapplicabletohexavalentchromiumcompoundsforsurfaceprocessing.Substances:Polychlorinatedbiphenyls(PCB),polychlorinatednaphthalenes(PCN),polychlorinatedterphenyls(PCT)TargetsCriteria/thresholdlevelsEffectivedateofthebanonthedeliveryLevel1-Alluses-Intentionallyadded-50ppm(or0.005wt%)ormoreofthematerialsBanned*When"Intentionallyadded"andanumericalvalueareshownin"Criteria/thresholdlevels",bothofthemshallbesatisfied.Substances:Short-chainchlorinatedparaffins(SCCP)Short-chainchlorinatedparaffinswithcarbonchainlength;10-13TargetsCriteria/thresholdlevelsEffectivedateofthebanonthedeliveryLevel1-Alluses-Morethan1000ppm(or0.1wt%)ofthematerialsBannedCopyright2013SonyCorpSS-00259(12thEdition)forGeneralUseSubstances:Polyvinylchloride(PVC)andPVCblendsTargetsCriteria/thresholdlevelsEffectivedateofthebanonthedeliveryLevel1-SubstratesforFeliCacontactlessICcards-Fabricsandcoatingagentsusedforcarryingbags,carryingcases,andcarryingpouchesforthefollowingproducts(excludingthoseforprofessionaluse):Personalcomputers,digitalcameras,videocamcorders,andportableaudioproducts-Cabletiesusedforaccessoriesandconnectingcords-Packagingcomponentsandmaterialstoprotect,contain,ortransportproductsorsuppliedaccessories(e.g.bags,adhesivetapes,cartons,andblisterpacks)Notethatpackagingcomponentsormaterialsfordevices,semiconductors,andanyothercomponents(e.g.trays,magazinesticks,stoppers,reels,embossedcarriertapes)areexcluded-Heatshrinktubes-Flexibleflatcables(FFC)-Insulatingplates,decorativepanels,labels-Sheets,andlaminates(includingsheetsandlaminatesusedforexteriorofwoodenspeakers)-Suctioncupsformountingin-vehicleproducts-IntentionallyaddedBannedLevel3-AllapplicationsotherthanLevel1-IntentionallyaddedExemption-Binderforresinsusedforpaints,inks,coatingagents,adhesivesetc.Substances:Tris(2-chloroethyl)phosphate(TCEP)CASNo.115-96-8TargetsCriteria/thresholdlevelsEffectivedateofthebanonthedeliveryLevel2-Flameretardantsusedinplastics,resins,fabrics,andtextiles-Morethan1000ppm(or0.1wt%)ofthepartsJuly1,2014Substances:OtherchlorinatedorganiccompoundsTargetsCriteria/thresholdlevelsEffectivedateofthebanonthedeliveryLevel3-Flameretardantsusedforprintedwiringboardlaminate-Morethan900ppm(0.09%)chlorinecontentbyweightinthelaminateN/A-Flameretardantsorplasticizerscontainedinplasticpartsotherthantheabove-IntentionallyaddedCopyright2013SonyCorpSS-00259(12thEdition)forGeneralUseSubstances:Polybrominatedbiphenyls(PBB)TargetsCriteria/thresholdlevels(*)EffectivedateofthebanonthedeliveryLevel1-Alluses-Intentionallyadded-1000ppm(or0.1wt%)ormoreinthehomogeneousmaterialsBanned*When"Intentionallyadded"andanumericalvalueareshownin"Criteria/thresholdlevels",bothofthemshallbesatisfied.Substances:Polybrominateddiphenylethers(PBDE)(includingdecabromodiphenylether[DecaBDE])TargetsCriteria/thresholdlevels(*)EffectivedateofthebanonthedeliveryLevel1-Alluses-Intentionallyadded-1000ppm(or0.1wt%)ormoreinthehomogeneousmaterialsBanned*When"Intentionallyadded"andanumericalvalueareshownin"Criteria/thresholdlevels",bothofthemshallbesatisfied.Substances:Hexabromocyclododecane(HBCDD)CASNo.25637-99-4,3194-55-6,134237-50-6,134237-51-7,134237-52-8TargetsCriteria/thresholdlevelsEffectivedateofthebanonthedeliveryLevel2-Alluses-Morethan1000ppm(or0.1wt%)inthepartsJanuary1,2014Substances:OtherbrominatedorganiccompoundsTargetsCriteria/thresholdlevelsEffectivedateofthebanonthedeliveryLevel3-Flameretardantsusedforprintedwiringboardlaminate-Morethan900ppm(0.09%)brominecontentbyweightinthelaminateN/A-Flameretardantsorplasticizerscontainedinplasticpartsotherthantheabove-IntentionallyaddedSubstances:Trisubstitutedorganotincompounds(includingtributyltin(TBT)compoundsandtriphenyltin(TPT)compounds)Metaltin,tinalloys,tinplatingandtininorganiccompoundsdonotfallunderthiscategory.TargetsCriteria/thresholdlevels(*)EffectivedateofthebanonthedeliveryLevel1-Alluses-Intentionallyadded-Morethan1000ppm(or0.1wt%)ofthetincontainedinmaterialsBanned*When"Intentionallyadded"andanumericalvalueareshownin"Criteria/thresholdlevels",bothofthemshallbesatisfied.Copyright2013SonyCorpSS-00259(12thEdition)forGeneralUseSubstances:Dibutyltin(DBT)compoundsMetaltin,tinalloys,tinplatingandtininorganiccompoundsdonotfallunderthiscategory.TargetsCriteria/thresholdlevelsEffectivedateofthebanonthedeliveryLevel1-Allapplicationsincludingadditivesofplastics(exceptLevel2below)-Morethan1000ppm(or0.1wt%)ofthetincontainedinmaterialsBannedLevel2-One-componentandtwo-componentroomtemperaturevulcanisationsealants(RTV-1andRTV-2sealants)-One-componentandtwo-componentroomtemperaturevulcanisationadhesives(RTV-1andRTV-2adhesives)-Catalystsforpaintsorcoatingagents-StabilizersinPVCusedforcoatingoffabricsintendedforoutdoorapplications-Additivesofsoftpolyvinylchloride(PVC)profileswhetherbythemselvesorcoextrudedwithhardPVC-Morethan1000ppm(or0.1wt%)ofthetincontainedinmaterialsJuly1,2014Exemption-Additivesofreusedpackagingcomponentsandmaterialsforpartsanddevices-Additivesofpackagingcomponentsormaterialsfordevices,semiconductors,andanyothercomponents(e.g.trays,magazinesticks,stoppers,reels,embossedcarriertapes)N/ASubstances:Dioctyltin(DOT)compoundsMetaltin,tinalloys,tinplatingandtininorganiccompoundsdonotfallunderthiscategory.TargetsCriteria/thresholdlevelsEffectivedateofthebanonthedeliveryLevel1-Additivesoftextiles-Morethan1000ppm(or0.1wt%)ofthetincontainedinmaterialsBannedSubstances:AsbestosTargetsCriteria/thresholdlevelsEffectivedateofthebanonthedeliveryLevel1-Alluses-IntentionallyaddedBannedCopyright2013SonyCorpSS-00259(12thEdition)forGeneralUseSubstances:SpecificazocompoundsAzodyesthatformanyoftheaminecompoundslistedinTable4.2bthroughthedecompositionmethodscitedinREACHRegulation(EC)No.1907/2006/AnnexXVIIandaminecompoundsinTable4.2bTargetsCriteria/thresholdlevelsEffectivedateofthebanonthedeliveryLevel1-Additivesoftextilesandleathers-Morethan30ppm(or0.003wt%)intextilesandleathersBannedTestingmethods(forreference)Themethodsfordecomposingazocompoundsandthenextractingaminesareasfollows.1)EN14362-1:20032)EN14362-2:2003Table4.2bListofspecificaminecompoundsCASNo.Aminecompounds92-67-14-aminodiphenyl92-87-5benzidine95-69-24-chloro-o-toluidine;4-chloro-2-methylaniline91-59-82-naphthylamine97-56-3o-aminoazotoluene99-55-82-amino-4-nitrotoluene;5-nitro-o-toluidine106-47-8p-chloroaniline615-05-42,4-diaminoanisole101-77-94,4'-diaminodiphenylmethane;4,4'-methylenedianiline91-94-13,3'-dichlorobenzidine119-90-43,3'-dimethoxybenzidine119-93-73,3'-dimethylbenzidine838-88-03,3'-dimethyl-4,4'-diaminodiphenylmethane;4,4'-diamino-3,3'-diphenylmethane120-71-8p-cresidine;6-methoxy-m-toluidine101-14-44,4'-methylene-bis-(2-chloroanilene)101-80-44,4'-oxideaniline139-65-14,4'-thiodianiline;4,4'-diaminodiphenylsulfide95-53-4o-toluidine95-80-72,4-toluylenediamine;4-methyl-m-phenylenediamine137-17-72,4,5-trimethylaniline90-04-0o-anisidine60-09-34-aminoazobenzeneCopyright2013SonyCorpSS-00259(12thEdition)forGeneralUseSubstances:FormaldehydeTargetsCriteria/thresholdlevelsEffectivedateofthebanonthedeliveryLevel1-Thewoodenproductsmadefromfiberboard,particleboard,orplywood,whichareemployedinproducts(e.g.speakersandracks)-Thedetailsareasfollows.BannedThresholdlevel(emissioncontent):Obtainthevaluebyanyoneofthefollowingmethods.1)[Withachambermethod]Concentrationintheair:Equaltoorlessthan0.1ppm(or0.124mg/m3)inanair-tighttestchamberwhosevolumeis12m³,1m³,or0.0225m³2)[Withaperforatormethod]-Equaltoorlessthan8.0mgin100gofaparticleboard/fiberboardwithoutasurfacetreatment(thevaluederivedfromtheone-timemeasurementbasedonEN120)3)[Withadesiccatormethod]-Averagecontent:0.5mg/lorless-Maximumcontent:0.7mg/lorless(UseN=2tochecktheaverageandmaximumvalues.)Testingmethods:-AchambermethodspecifiedinEN717-1:2004-AperforatormethodspecifiedinEN120:1992-AdesiccatormethodspecifiedinJISA5905(Fiberboards)andJISA5908(Particleboards)Substances:Specificbenzotriazole2-(3',5'-Di-tert-butyl-2'-hydroxyphenyl)benzotriazole(CASNo.3846-71-7)TargetsCriteria/thresholdlevelsEffectivedateofthebanonthedeliveryLevel1-Alluses-IntentionallyaddedBannedSubstances:Dimethylfumarate(DMF)CASNo.624-49-7TargetsCriteria/thresholdlevelsEffectivedateofthebanonthedeliveryLevel1-Alluses-Morethan0.1ppmofthematerialsBannedSubstances:BerylliumoxideTargetsCriteria/thresholdlevelsEffectivedateofthebanonthedeliveryLevel1-Alluses-IntentionallyaddedBannedSubstances:BerylliumcopperTargetsCriteria/thresholdlevelsEffectivedateofthebanonthedeliveryLevel3-Alluses-IntentionallyaddedSubstances:CobaltdichlorideTargetsCriteria/thresholdlevelsEffectivedateofthebanonthedeliveryLevel1-Moistureindicatorusedforadesiccantagent(e.g.silicagel)-Humidityindicatorcardwhichisimpregnatedwithcobaltdichloride-Inten