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Automated
Test
System
Automation
&
ControlCase
Studies:
Solar
PowerAgendaSolar
Energy
FundamentalsAutomated
TestPhotovoltaic
(PV)
cellI‐V
characterizationSystem
Automation
and
ControlPVsemiconductor
process
control
and
monitoringPVpowerplant
electrical
monitoring
andsuntrackingcontrolAvailabilityWith
a
solar
cell
efficiency
of20
percent,
anareathesize
ofTexascould
supply
the
entire
world’senergy
demands
[1].The
black
dots
represent
the
land
area
required
toreplace
the
total
primary
energy
supply
withelectricity
from
solar
cells.Available
solar
energy
(left)
greatly
exceedsglobal
energy
consumption.The
Solar
Energy
MarketSolarenergy
technologies,
which
harness
the
sun’senergy
to
generate
electrical
power,
areone
of
thefastest
growingsourcesof
renewable
energy
on
the
market
today.US
Photovoltaic
Shipments,
1997-2006*Courtesy
US
Energy
InformationAdministrationSolar
Power
Generation
TechnologiesPhotovoltaic
(PV)
solar
cellsSolar
thermal
collectorsIndustry
Challenges
for
Solar
PowerDesign
more
efficient
solar
cellsIncreasing
the
amount
of
power
per
area(watt/m2)through
better
design
andtestingIncrease
theeconomic
viability
of
new
technologies,such
as
solartrackingtoincrease
solar
celloutputLower
the
production
costofsolar
cellsIncrease
automation
for
more
efficientmanufacturingwith
less
scrapAgendaSolar
Energy
FundamentalsAutomated
Testl ‐System
Automation
and
ControlPVsemiconductor
process
control
and
monitoringPVpowerplant
electrical
monitoring
andsuntrackingcontrolPhtoovoltaic(PV)celIVcharacerizationtCase
Study:
Automated
Semiconductor
Characterization
and
ValidationA
test
system
that
can
automaticallycharacterize
an
integrated
circuit
undervarying
conditionsEngineering
Challenge:
synchronizemultiple
instruments
and
maintain
verytight
timing
and
triggeringIC
Characterization
SystemThe
system
contains
a
mix
ofdigital
and
analog
instruments
forcontroland
measurement
including:100MHzfrequency
generators
to
triggersand
synchronizes
otherdevices
and
provide
a
common
base
clock.A
100
MS/s
arbitrary
waveform
generatorAhigh‐speed
digital
I/Omodule
to
output
amodulated
digital
pattern
tothe
chipKeyadvantages
of
this
implementationIntegrationof
the
analog
and
digital
instruments
in
one
systemVery
tight
controlover
timing,
minimizing
jitterSoftwareflexibilityto
adaptto
each
IC’s
controlrequirementsEnablingTechnologiesPrecision
DC
instrumentationMeasurement
of
voltage,
current,
resistance,andotherfactorsCharacterizing
a
Solar
Cell’s
PerformanceMeasureVoltage
and
CurrentRatings
(VOC
and
ISC)Maximum
Current,
Isc
occurs
whenthe
load
is
a
shortMaximum
Voltage,VOC
occurs
whenthe
load
is
openCalculate
EfficiencyMaximum
Power
(PMAX)Power
=
0
at
Isc
and
VOCPower
reaches
maximum
at
VMP
and
IMPFillFactorMain
measure
of
cell
qualityCompare
maximum
power
(PMAX)
to
theoretical
maximum
power
(PT)
based
on
Isc
and
VocEfficiency(η)Ratio
ofoutput
power(POUT)
toInput
Power
(PIN)Formaximum
efficiency,
POUT
=
PMAXPIN
is
the
product
ofirradiance(W/m2)
andthe
areaofthecell
(m2)
PMAX
PoutPinMAXPinFactors
that
affect
EfficiencyEfficiencyisreduced
byparallel
shunt
(RSH)
andseries
(RS)
resistancesApproximate
RSH
and
RSfrom
IVcurveDirect
Semiconductor
ResistivityMeasurement4
point
probeWidely
used
method
to
measure
resistivity
ofsemiconductorFlowing
current
into
thecircuitconnected
to
1,4
pointof
contactMeasuring
voltage
connectedto2,3pointof
contactResistivityρis
below:ρ=2πLp(V/I)1234Measurement
HardwareSource
Measure
Unit
(SMU)Sourcesbothpositive
&
negativecurrents,
thenmeasures
theresultingvoltageAlso
used
to
sink
(ordissipate)
current
whentesting
outputshort
circuitcurrents
and
leakage
currentsNIPXI‐4130
Power
SMU• +/‐
20V,
2A
isolated
output10nA
/100uV
source
resolution5currentranges–
2A
to
200uA4‐quadrantoperation
–
up
to
10WSinkRemote
sense
capabilitySMU
ChannelQuadrant
DiagramDemo
–
Solar
Cell
Characterization4‐quadrant
IV
tracingLabVIEW
analysis
and
displayAgendaSolar
Energy
FundamentalsAutomated
TestPhotovoltaic
(PV)
cellI‐V
characterizationSystem
Automation
and
Controlr•controlPVsemiconudctoproesscontrocdmonitoigrPVpowerplantleeccrtrialmonitoigadsntrackingunnnlanCase
Study:GigaMat
TechnologiesPerform
automated
semiconductor
wafer
sorting
based
upon
physical
and
electrical
characteristicsMeet
or
exceed
the
precision
andrepeatability
of
industry
standardequipment
but
with
greater
throughput,
flexibility
and
user
friendliness,
and
atmuch
lower
costGigaMat
Sorting
SystemNI
LabVIEW
is
used
to
synchronize
motion,vision,
and
instrumentationThis
project
wouldn’t
have
been
economicallyviable
without
LabVIEW
and
NI
synchronizedmotion,
vision,
and
DAQ
products.
EdmondAbrahamians,
President
and
CEO
ofGigamatEnablingTechnologiesSynchronized
motion,
automated
visualinspection,
and
measurementReal‐time,
deterministic
controlManufacturing
silicon‐basedPhotovoltaic
(PV)
cellsRefining
rawmaterialMelting
&
growing
crystalSlicing&treatmentPoly-siliconIngotWaferEtching,coating,inserting
electrodeCircuitconnecting
&
PackingIntegratingwithcontrol/monitoringsystemPV
CellPV
ModulesPlant
SystemPV
Control
&Measurement
RequirementsPoly-silicon&
IngotWaferPVcellPVmodulePlantsystemRequiredcontrol
&measurementtechnologiesTemperaturemonitoringInspection
ofcrystal
growthTemperaturemonitoringMachinevisionGeneratedvoltageTemperaturecontrolI-V
Curve
TestI-V
Curve
testMeasuringinsulatedresistorInvertercontrolSun
trackingElectricalProcesscontrolinspection4
point
probeMicro
crackinspectionMicro
crackinspectionpower
qualitymonitoringProgrammable
Automation
Controllers
(PACs)PLC
ruggedness
andreliabilityPCopenness
andperformanceSynchronized
measurement
and
motioncontrolMeasurements
withPACsVoltage,
current,
temperature,
pressure,
stress/strain,…Digital,
counter/timers,pulse
width
modulation,
…Encoders,
resolvers,
LVDTs,
…Acquisition
speeds
beyond
800,000
Samples/secondNetworking
withPACsStandard
communication
to
PLCs,touch
panels,handheldsSupportforindustrial
networkssuch
as
Ethernet,
Modbus,CANOPC
ServersLocal
or
networked
dataloggingControl
withPACsDigital
true/false
logicState
chartsFPGA‐basedprotectioninterlocksHigh
speed
PID
controlAdvanced
andcustom
control
algorithms
(gain
scheduling,modelpredictive
control,
…)Attributes
of
a
Real‐Time
SystemReliability24
hour
operationwithout
crashesDeterminismEvent
ResponseClosed-LoopControlDiscreteManufacturingPIDProcess
ControlImagescourtesy
ofSchlumbergerLimited
andDanaCorporationDemo
–
Introduction
toLabVIEW
Real‐TimeMotion
Control
System
for
Sun
TrackerKey
Concepts:Timed
LoopsReading
and
Writing
I/OPID
controlDownloading
and
executingcodeon
a
real‐time
targetNICompactRIOPAC
ArchitectureReal‐TimeProcessorReconfigurable
FPGAExtreme
Ruggedness‐40to
70°C
temperaturerange50g
shock,5g
vibrationI/OModules•I/O
Modules
with
built‐in
signal
conditioning
for
connection
to
sensors/actuators•Reconfigurable
FPGA
for
high‐speed
and
custom
I/Otiming,
triggering,
control•Real‐Time
Processor
fordeterministic,
stand‐alone
operation,
logging
and
analysisLow
Power
Consumption9to
35
VDCpower,
7‐10WtypicalIntroductionto
Field
Programmable
Gate
Arrays
(FPGAs)•What
isit?A
silicon
chip
with
unconnected
gates•How
it
worksDefine
behavior
in
softwareCompile
and
download
to
the
hardware•AdvantagesHigh
performance
and
reliabilityApplication
runs
in
dedicated
hardwareReplace
expensive
custom
PCBsExtremely
flexible
and
reconfigurableFPGA
Technology:
Using
Software
to
DesignHardwareReplace
custom
hardware
with
software-programmable
FPGA
logicHigh
speed
control
(1MHz
digital
/counter-timer,200
kHz
motion
control/analog
PID)DedicatedlogicinsiliconforhighestreliabilitySignal
processing
(decoding
industrial
sensor
signals)33LabVIEW
FPGA
CodeAbstractionCoutnerAnalog
I/O I/O
with
DMALabVIEWFPGAVHDL
66Pages
~4000
lineDemo
‐
Introduction
toLabVIEW
FPGAExplore
LabVIEW
FPGAmotorcontrolKey
Concepts:Pulsewidthmodulation(PWM)for
motorcontrolHigh
speed
loops
executinginparallelFixed
point
signal
processing
foranalog
encodersensorsMotion
Control
RequirementsPrecision
Position
ControlMultiaxis
coordinationPickandplace,
profile
cuttingAutomatedtest,
DUT
handlingAccurate
Velocity
ControlConveyors,
variable
speed
motorsHigh
speed
I/O
synchronizationCustom
Motion
ProfilesMotion
Control
DevicesHardware SoftwareMotion
Controllers • Fast
Configuration
andTestPXI
and
PCI
InterfacesStepper
and
Servo
ControlMulti‐axis
coordination
(upto
8axis)Integrated
I/OEncoder
inputInteractive
testingInteractive
auto‐tuningRapid
Development
withMotion
AssistantDrives
and
MotorsUp
to
10Apeakstepper
and
servodrivesConnection
to
third‐partydrivesNEMAstandard
size
stepper
motorsPreview
windowsfor
visualizationLabVIEW
code
generationDemo‐
IntegratingTextBased
Code
in
LabVIEWIntegrate
onopen
source
sunangle
calculator
algorithmKey
Concepts:LabVIEW
openness
totextbasedcode
such
asC,HDL
andMathScriptUsing
the
LabVIEW
FormulaNodeDemo
‐
Putting
it
all
together2‐axis
Sun
Tracking
MotionControl
SystemKey
Concepts:Combiningmeasurement,control,and
algorithmsTwo
axis
PIDcontrolTime
travelSummary:
Enabling
TechnologiesPrecision
DC
instrumentationVoltage,current,
resistance,
etc…Synchronized
motion,
automated
visual
inspection,
and
measurementReal‐time,
deterministic
control演讲完毕,谢谢观看!附录资料:不需要的可以自行删除QTP自动化测试自动化测试的好处快速QuickTest执行测试比人工测试速度快多了。可靠QuickTest每一次的测试都可以正确的执行相同的动作,可以避免人工测试的错误。可重复QuickTest可以重复执行相同的测试。可程序化QuickTest可以以程序的方式,撰写复杂的测试脚本,以带出隐藏应用程序中的信息。广泛性QuickTest可以建立广泛的测试脚本,涵盖应用程序的所有功能。可再使用QuickTest可以重复使用测试脚本,即使应用程序的使用接口已经改变。QTP背景BTO:BusinessTechnologyOptimization业务科技优化方案使IT系统既能满足质量和成本的需求,又能适应多变的业务需求,可随之改变QTP是HP花费45亿美元购买的Mecury公司测试产品套件之一QTP是继WR后推出以VBS为内嵌语言的测试工具用于功能测试QC产品协作进行自动化测试开发(BPT)BusinessProcessTesting特点:价格高昂但是容易掌握QTP应用范围自带插件ActiveX
Database
StdWindows
TEA
VisualBasic
Web
Xml额外购买插件Java
DotNet
PeopelSoftVisualAgesiebelOracleQTP基本功能介绍HP
QuichTest
Professinal支持功能测试和回归测试自动化,用于每个主要软件应用程序和环境。此解决方案使用关键字驱动的测试概念,简化了测试创建和维护过程。它使测试人员能够使用专业的不惑技术直接从应用程序屏幕中捕获流程来构建测试案例。测试专家还可以通过集成的脚本和调试环境完全访问内在测试和对象属性。QTP的基本功能介绍TestActionActionActionFunctionFunctionFunctionFunctionLibraryStepStepStep以Test为测试运行单位,每个Test包含若干类型Action。
以Action为最小单位映射对象库,多个Action之间可以共享统一对象库
Action内的Step可以包含用户录制操作或者函数库内对Function的调用StepStep使用QuickTest进行测试测试和业务组件测试:组织成一个或多个操作的步骤集合,用于验证应用程序是否按预期执行。业务组件:表示应用程序中单任务的步骤集合。业务组件(也称为组件)在MercuryQualityCenter中由业务流程测试组合为特定的场景以建立业务流程测试。测试流程使用QuickTest测试包括三个主要阶段创建测试或组件以下列一种或两种方式向测试中添加步骤在应用程序或网站上录制会话。建立对象库并使用这些对象在关键字视图或专家视图中手动添加步骤然后,使用特殊的测试选项或编程语句来修改测试或组件。通过用参数替换固定值拓宽测试或组件的范围使用设计的数据表中的数据QuickTest生成随机数据使用QuickTest中众多的功能测试功能来增强测试或组件,或添加编写语句来实现更复杂的测试目标。运行测试或组件运行测试或组件检查网站或应用程序运行测试或者组件以对其进行调试单步执行单步跳过单步退出设置断点使测试或组件在预定点暂停分析结果在“结果”窗口中查看结果。报告在运行会话过程中检测到的缺陷。QuickTest窗口标题栏&菜单栏文件工具栏调试工具栏测试工具栏操作工具栏测试窗格:关键字、专家试图数据表运行窗口调试查看器基本使用介绍各个按钮介绍QuickTest如何识别对象确定对象符合的测试对象类对测试对象进行分类标准Windows对话框(Dialog)Web按钮(WebButton)
VisualBasic滚动条对象(VbScrollBar)强制属性列表添加辅助属性特殊的顺序标识应用测试对象模型在录制时执行应用程序的相应操作,则QuickTest将标识QuickTest测试对象类(表示执行了操作的对象),并创建相应的测试对象读取应用程序中对象属性的当前值,然后将属性和属性值列表与测试对象一起存储选择该对象的唯一名称,一般使用该对象某个重要属性的值使用适当的QuickTest测试对象方法录制对对象执行的操作实例<INPUTTYPE="submit"NAME="Find"VALUE="Find">对象标识为WebButton测试对象创建一个名为Find的WebButton对象为FindWebButton对象存储属性和属性值属性值typeFindnameresetHtmltaginput实例(续)录制对WebButton执行了Click方法关键字视图专家视图Browser("MercuryInteractive").Page("MercuryInteractive").WebButton("Find").Click核心功能清单对象库描述性编程检查点对象属性运行期间变更数据驱动错误恢复自动化对象核心功能-对象库入口:
tools->ObjectRepository
Ctrl+R
功能
保存被测试对象属性,
在编写执行步骤时使用核心功能-对象库对象库中的对象可以在录制过程中自动产生,也可以手动添加指定对象对象库分为本地对象库和共享对象库,区别是:
本地对象库只应用于本地Action调用共享对象库以.tsr扩展名文件形式存在,可以被其他Action调用。对象库面板具有定义以及更新对象的功能,并且能够进行在被测软件和对象库之间双向查找对象。对象属性可以在对象库中被任意修改,并且其属性描述支持正则表达式。核心功能-对象库智能识别是鸡肋,辅助标识符要慎用对象库与描述性编程的区别:对象库将对象收集起来,以可视化的方式呈现给用户描述性编程在运行步骤中通过对象属性指定对象。结合使用时应注意:描述性编程的子对象不可以是对象库中的对象,反之可以。具体采用哪种方式指定对象因具体情况和个人喜好所定,并非描述性编程更“高人一筹“核心功能-对象库-简单的对象识别原理用户通过录制或指定对象属性的方式将一个对象添加到对象库,在录制过程中添加的对象是根据Tools->ObjectIdentification中的
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