高分子研究方法-afm之间相互

ᒫԫ AFM SingleMoleculeForceSpectroscopy,SMFS* AFMNanomechanics,AFMNanomechanicalMap ᒫԫ AFM弹簧”=“弹性常数”；

ᒫԫ AFM n=400&] ]

n

高分子/纳米

细单分子水平分子识生物功能的ܔᜓᎸᑪݢզፗളᜓ ᜓᜓଘᕳ֢ አᜓቘ,ᘒӧฎᕹᦇଘᜓጱᕮᜓ DNA拉rupturecontour β-ರݖᕮᜓጱᥴರβ-β-ರݖᕮᜓጱᥴರᘸݳᇔᜓᜓ֢አጱፗളၥβ-ರݖᕮᜓጱᥴರᢓጮᥴರݖ给-受体相互作GaubH.E.,et.al.Science,1994,264,ᘸݳ给-受体相互作GaubH.E.,et.al.Science,1994,264,ᘸݳᇔᜓᜓ֢አጱፗളၥᘸݳᇔᜓᜓ֢አጱፗളၥܔᜓᨏਧਧṛᜓܔสӾݳᇔ᱾ᜓፘᜓ֢አᘸݳᇔᜓᜓ֢አጱፗളၥJ.Am.Chem.Soc.2011,133,ᕑᔂ ᜓࢶᨏᕑᔂ ᜓࢶᨏdeflectionᕑᔂ ᜓࢶᨏdeflectionᕑᔂێᜓࢶᨏളᜓێᜓቘᦞ(contac ളᜓێᜓԆᥝᎸᑪፘᜓള֛ጱݒ୵ᜓᜓ҅ᧆᜓᑀӾጱᇔቘᜓහᜓቘᦞአԭᜓාێᜓᜓࢴ֛ێ҅ԆᥝᵞӾᜓ୨̵ᔌ୨ᜓ֛ᜓयᜓ֛ᜓᶉාᜓۖාളᜓӾᦇᓒ̶ളᜓێᜓӾጱ໐ஞฎ҅ජർጱݻڔᜓ፳̵ᔌێጱݻ* ቖ֛ᜓ୨ᜓᜓ ᜓᜓࢺᜓ֛ᜓ୨ᜓቖ֛ᜓ୨ᜓᜓ ᜓᜓࢺᜓ֛ᜓ୨ᜓᑮᜓጱӷӻፘݶᜓஆጱ

ӷӻቖ֛ጱളࢺ֛ጱളᕑᔂ ᜓࢶᨏള ᜓቘᦞ(contac ᕑᔂ ᜓࢶᨏള ᜓቘᦞ(contac ୨ ֛ ੜ୨ᜓଫݒ(ᔌᴫ ාᜓ҅ܨޕᜓ̶ ୨ᜓቖᜓ୨ᜓଘᶎളᜓ ᜓᑕ֢ አԭᜓᶎᑌԏक़ጱํᴴ܄ऒԭHertzian୵ኴᶎӧ୵౮nec

୨ᜓቖᜓ୨ᜓଘᶎDerjaguin,B.;Muller,.M.;oporo,..J.ColloidInterfaceSci.1975,53,314.ള ᜓ ᜓ ቘ -D M T ള ള ቘᦞ Ꭸᑕᜓᶎ(ᔌᴫ) ᜓ҅ አԭളᜓᶎᑌᦜੴऒݒ୵/neckጱ୵

୨ᜓቖᜓ୨ᜓଘᶎᔌ୨ളJohnson,K.L.;Kendall,K.;Roberts,A.SurfaceenergyandthecontactofelasticProc.R.Soc.A1971,324,ള ቘᦞ Contactᕑᔂ ᜓࢶᨏ1SBR/IR7:3BlendHHh/0/forceforce----

IRRegionJKR

1.40±0.18(10µm)2

- - - - deformation21forceforce- ZnORegion

force- force-- -- ~0.8 -

--

- - deformation

--

- - deformation

SBR/IR7:3共混物(10µm)0-

Deformation/Deformation/Hight/Wr/Wr/w/Jm-Log(E/PaYoung’sModulus

DeformationAdhesiveEnergy

ViscoelasticႰᇔኴPP/PA6/PS:70/15/15 PP/PA6/PS:40/30/30 PP/PA6/PSTHF刻蚀 PP/PA6/PS:甲酸刻蚀 (whichisPP/PA6/SEBS70/15/151phr 10phrႰᇔኴPS/PMMA

聚合物/填料复合材料Ⴐᇔኴ尼龙6PA6)/聚烯烃弹性体(POE)(80/20)未增 反应增容(POE-g-MA/PA6)PA6:2.9±1.1GPa;POE-g-MA,POE:25.5±10.3MPaႰᇔኴ未容未容25.5MPa反应反应容Ⴐᇔኴ未容9.7±3.6未容反应容反应容ႰᇔኴPCL/PVC72度分别退⽕5,20和50分钟后杨⽒模量分布

Ⴐ ኴ

PVC:3.2±0.4GPa,PCL:340±38.0MPa.55428.5MPa3210-0.58MPa--0SampleDeformationႰ ኴEForce碳⿊填充橡胶(5phr) EForce66543210(boundrubber)；界⾯⼏到100nm多尺度纳⽶纤维a

StiffnessStiffness3

0.0020.40.60.81.0Position10

10 ConcentrationၫNumberofdsDNAmolecules,ၫ

ዩᓀNanomechanicalNanomechanicalcluesfrommorphologicallynormalcervicalsquamouscellscouldimprovecervicalcancerscreening†Nanoscale,7,15589 (Nanoindentation)҅ԞᑍႮଶභఽ(Depth-SensingIndentation, ᓌܔፗᥡጱၥᦶ ොဩԏӞ҅ݢզᜓᕑᔂ੮ଶӤၥᨶᜓාጱݱ ᜓᜓᨶ҅ইᜓរ֖ ̵ Modulus)̵Ꮭଶ̵ොාᜓ(FractureToughness)̵ଫݒᏝ۸පଫ(Strai̵ᔌ୨ᜓ(Viscoelastic)ᜓᜓݒ(Creep)̶ଫአᜓࢱғᏝᜓා҅ইᨶᜓ҅ᵄና̵ሾ࿔ᜓᚇ ܨӞᇙਧ୵ᇫᜓ੮ੑ १҅ᜓӞ࣮ ӥ ᦶᜓ҅ උܨݸ ᜓ ᨶ ၥ ᨶ ደ ጱ ොා ౼ ᶎ ᶎ ᑌ ᨶ ᜓᕚፊ Ⴎଶ̶Ӟӻਠෆደᨶᑕ۱ೡӷӻྍṈ҅ܨಅ᧲ᜓᨶᑕӨܬᜓᨶᑕ̶ᜓ ᜓᨶᑕӾ҅ १ क़ᜓរֵ҅ ᜓᨶᶎ҅ᵋ፳ᜓរጱා ᜓߝጱႮଶԞᵋԏ҅ ୮ᜓរᨶ ᜓ҅ᑏᴻक़ᜓ҅ᜓߝᨶտᜓྍ ኸጱ

ደደ

ᜓរ-֖ ᑏ ใᕚ Ӟᇙਧ୵ᇫᜓ੮ੑ १҅ᜓӞ࣮ ӥ

ᦶᜓ҅

Ꮭଶғᜓාಽಯक़ᇔ ᨶᶎጱ

Pharrොා**ᔂ Fᜓ250ஙᇍᶷӥᜓរ֖ᑏใ ኴᶎᜓ

यᜓ୵ݒ ดங᳒ጱଫአᨶᜓ ኪ

(conductive-AFM, (frictionforcemicroscope, (magneticforcemicroscope, (ScanningThermalཛྷMด ᳒ - ᕁ क़ ᘶཛྷ

AFMଫአӾฃᜓ ጱᜓᜓᵙᜓ ด 接触接触导电导电针外加电ᜓ ด ด

ด

ᜓ ด

电⼦给体(donor)P3HT,PTB7,PCPDTBT,PCBMᜓ ด

ᜓ ด 5!m×5!

5!m×5!257nm±108nm(THF)+1 65nm±23nm(DCB)

65nm±23nm(DCB)c-AFM ด

P3HT纳⽶线/PCBM 能电AFM⾼度 pc-AFM光电流

~20nmᜓኪ̵

ด

I-V~202+2

~370ᜓኪ̵ ኪᨶᜓጱᐃഖҔ

ด ⼯作原 ⼯作原 硬盘形貌和MFM图(5!m×5mർ ׆ݻ)ด ᜓLFMAFM接触模 z轴⽅向载 ᜓLFM ᜓLFM⾼度 化磷混合物 ᜓLFM*恒定载荷：摩擦系数=FL/FN*RampedPost-

A：弱粘结；B AFM AFM ᅩᴣාᨶᶎᕑ AFMᨶᜓᨶᶎᜓ༁ ኪ ද* 凹痕深度10nm* p Aᶎp PMMA ScratchlithographyonPC14!

35Nm20N载荷10!mscan ኪ۸ᜓᨶᶎද ኪ۸ᜓᨶᶎද(5!m×5!m (15!m×15!m AFMᕑ (AFMScanningProbeLithographyTip-basedDip-penNanolithographyisascaninᡞroeli rphy hiquewhereanatomicforcemicroscope(AFM)tipisusedtocreatepatternsdirectlyonarangeofsubstanceswitha varietyofinks.笔：AFM纸：各种基板，如⾦，SiO2Dip-penNanolithographyDip-penNanolithographyಚൈාᅾ ಚheightimage thermalimageಚᅾดTmಚᅾด IR

IR ingresolutilimitsofPower&limitsofAFMc