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期末复习专业外语考试题型一、汉译英(20分)10个词,每个词2分二、英译汉(20分)10个词,每个词2分三、翻译句子(40分)10个句子,每个句子4分四、翻译(20分)一整段或者几个句子考试注意事项一、考试时间:2个小时

7月11日9:00-11:00经信F2二、不允许带词典(包括电子词典)三、手机关机(用手表看时间)四、不允许上厕所五、交卷要在一个小时十分钟之后!!!复习题一、掌握(给出汉语可以写成英文)semiconductor:半导体photoconductivity:光电导性(率)rectification:整流intrinsicproperties:本征特性Halleffect:霍尔效应currentcarriers:载流子carriermobility:载流子迁移率silicon:硅(Si)germanium:锗(Ge)solarcell

:太阳电池一、掌握(给出汉语可以写成英文)alkali

halide:碱金属卤化物transistor:晶体管solid-statelaser

:固体激光器opticalfiber:光纤quantummechanics:量子力学potentialbarrier:势垒,位垒periodiclattice:周期点阵activationenergy:激活能electron-holepairs:电子、空穴对dislocation:位错一、掌握(给出汉语可以写成英文)ionimplantation:离子注入fieldeffect-transistor:场效应晶体管wafer:晶片Wetchemicaletching:湿法化学刻蚀diffractioneffect:衍射效应birefringent:双折射的indexofrefraction:折射率focallength:焦距

donor:施主acceptor:受主一、掌握(给出汉语可以写成英文)interferencecontrast:干涉相称valenceelectron:价电子Liquidphaseepitaxy(LPE):液相外延Fieldeffect-transistor(FET):场效应晶体管Integratedcircuit(IC):集成电路Light-emittingdiode(LED):发光二极管Metal-Oxide-Semicondutor(MOS):金属氧化物半导体;physicalvapordeposition(PVD):物理气相沉积;chemicalvapordeposition(CVD):化学气相沉积numericalapertures(NA):数值孔径negativetemperaturecoefficientofresistance:电阻的负温度系数silversulphidel:硫化银poly-crystallineingots:多晶块titanium:钛(Ti)zirconium:锆(Zr)tellurium:碲(Te)leadsulphide:硫化铅ironpyrites:黄铁矿selenium:硒(Se)copper:铜二、认识(给出英语能翻译成汉语)Transmissionpolarizedlightmicroscopy:透射偏光显微术wavelength:波长radioreceivers:无线射频接收器、无线电接收机galena:方铅矿photocell:光电管、光电池copperoxide:氧化铜crystaldetector:晶体检波器vacuumtube:真空管infrareddetector:红外探测器fieldsofforce:力场二、认识(给出英语能翻译成汉语)N-folddegenerate:N度简并oscillator:振子Pauliprinciple:泡利不相容原理excitedstates:激发态potentialbarrier:势垒、位垒magnesium:镁filledband:满带emptyband:空带thermallyexcited:热激发intrinsicconduction:本征导电二、认识(给出英语能翻译成汉语)二、认识(给出英语能翻译成汉语)X-raytopography:X射线形貌学OpticalMicroscopy:光学显微术(镜)stackingfault:层错Etchant:蚀刻剂crystallography:结晶学polishingetch:抛光腐蚀selectiveetch:选择腐蚀avalanche:雪崩anodic:阳极的cathodic:阴极的infraredspectroscopy:红外光谱学二、认识(给出英语能翻译成汉语)Cr:chromium:铬depthoffield:景深,视场深度resolution:分辨率

compoundmicroscope:复显微镜magnification:放大倍数(倍率)transmittedlightmicroscope:透射式光学显微镜reflectionmicroscopy:反射显微技术

Czochralskigrowth:提(直)拉法生长

polarize:偏振片、起偏器prism:棱镜三、句子1、Itis,nevertheless,ahightributetotheskillandcareofmanyexperimentersthat,inspiteofthis,semiconductorshadbeenrecognizedasadistinctclassofsubstancesandtheirmainpropertiesappreciatedlongbeforeacomprehensivetheorywasavailabletoaccountforthem.P12、Theseeffectsarenowknowntobeduetooxidefilmsoractualgapsseparatingtheindividualcrystalsbutledtothemetalstitaniumandzirconiumoncebeinglistedassemiconductors.P13、Itmustbeadmitted,however,thatnoinfalliblecriterionwasavailabletillthequantumtheoryofsolidsgaveanunderstandingofthereasonsforthevariouspropertiesobserved.P14、AreviewofthisearlyworkhasbeengivenbyK.Lark-Horowitztogetherwithaveryextensivebibliographycontainingover350references.EarlierreviewsbyB'Guddenalsodealextensivelywiththisphaseanddiscussinsomedetailtheproblemsofidentifyingsemiconductors.

P25、Thelatter,whichisgenerallyknownasthecarriermobility,andwhichweshalldefinemorepreciselylatergenerallytendstodecreaseasthetemperatureisraised,especiallyatthehighertemperatures,andthisaccountsforthedecreaseinconductivityofmetalswithincreasingtemperature.

P36、Thesubstancesconcernedweremainlymetallicoxidesandsulphidesandthe‘defect’semiconductorswerethosewithametalliccontentlessthanthatcorrespondingtostoichiometriccomposition,i.c.oxidizedcompounds.

P47、Theimportanceofthisworkwasinshowingthevitalpartplayedbysmalldeviationsfromstoichiometriccompositionindeterminingthepropertiesofcompoundsemiconductors.

P48、Althoughtheyarenotstrictlysemiconductorsbutinsulators,mentionmustbemadeofthelargeamountofresearchcarriedoutbyR.W.Pohlandhiscollaboratorsonthealkalihalides,sincethishelpedgreatlytoclarifymanyofthepropertiesofsemiconductors.P49、Muchoftheuncertaintyoftheearlyworkonsemiconductorsarosethroughafailuretodifferentiatebetweeneffects,whichariseinthebulkofthematerial,andthose,whicharecharacteristicofthesurfaceoroftheinterfacebetweentwodifferentmaterials.P510、Theuseofsinglecrystalshasenablednotonlytheseparationofthebulkandsurfacepropertiesbuthasalsoenabledthesurfaceandtheinterfacebetweentwotypesofsemiconductor,orbetweenasemiconductorandametal,tobestudiedinmuchgreaterdetail.P511、Morerecentlythestudyofamorphoussemiconductorshasledtoafullerappreciationofthoseproperties,suchashighcarriermobility,thatdependprincipallyonthequalityofthecrystalsbeingstudiedandthosemorefundamentalpropertieswhichdonotdependonlong-rangeorder.P512、Thephotoconductivepropertiesofselenium,andofcopperoxide,havebeenusedtoprovideexposuremetersforphotographyandphotocells,whichareusedinthefilmindustryfortransformingthemarkingsonthesoundtrackintoelectriccurrentsforimplicationandreproductionbyloud-speakers.P513、Thediscoverythatafinewire,or‘cat’swhisker,incontactwithacrystalofsemiconductingmaterialmadeanexcellentrectifierforhigh-frequencycurrentsledtoagreatincreaseinthesensitivityofradioreceivers,andthistypeofdevicewaswidelyusedintheearlydaysofbroadcasting.P614、Themodernsuccessortothetransistoristheintegratedcircuit(IC.)inwhichmanytransistorsandtheirassociatedcomponentssuchasresistors,capacitorsetc.areproducedbycontrolleddiffusionofimpuritiesintoasmall‘chip’ofsilicon.P715、Heretheseforcesaresupposedtoattracttheelectronstronglyifitmovesoutsidetheboundary,andinthesimplestformofthetheoryitisassumedthattheysetupanimpenetrablepotentialbarrierwhichholdstheelectronsinthesolid.

P816、InSummerfield’stheory,theallowedenergylevelsforthevalenceelectronsofacrystalofmacroscopicdimensionslieveryclosetogetherandtheirvaluesextendfromnearlythebottomofthepotentialtroughinwhichtheelectronsmovetoindefinitelyhighvalues.

P917、IfnowwehaveNatomsinacrystal,andweassumethecrystaltobeexpandedsothatthelatticespacingbecomesverygreat,thentheallowedenergylevelswillbejusttheatomicenergylevelswhich,forthemoment,weshallassumetobenon-degenerate,i.e.eachhasaseparateenergy.

P1118、Thisnotonlyexplainswhy‘inner’electronsdonotcontributetoconductionbutitgaveWilsonthecluetotheessentialdeferencebetweenmetalsontheonehandandinsulatorsandsemiconductorsontheother.P1219、Mostofthesubstanceswithwhichweshallbeconcernedhavesuchastructure,butmaynotalwaysconsistoflargesinglecrystalsbutofaggregatesofverysmallcrystalswithrandomorientation.

P1320、Thenumberofexcitedelectronswouldincreasewithtemperatureinamannergovernedbyaprocesshavingan‘activationenergy’,oftheorderofΔEandweshouldexpectarapidincreaseoftheconductivitywithtemperature.P1421、AsweshallalsoseelatertheeffectofverysmallamountsofimpuritycanhaveamarkedeffectonthisactivationenergysothatmaterialswhichhaveconsiderablygreatervaluesofAEmaybehaveassemiconductorswhentheycontaincertain‘active’impurities.P1422、IfweassumethatthevariationwithTofthemobilityofelectronsandholesinanelectricfieldissmallcomparedwiththevariationintheexponentialfactorin(4)thenwehavefortheconductivityσ,whichisthensimplyproportionaltothenumberofcarriers,avariationoftheform.

P1523、Inmanyinstances,itisfoundthattheenergyrequiredtoexciteanelectronintotheconductionbandfromadonorlevelissosmallthattheelectronsfromall,theavailabledonorlevelsareexcitedandareintheconductionbandatroomtemperature.

P1624、Hence,forasemiconductorinthisconditiontheresistancewillincreasewithincreasingtemperature,tillatemperatureisreachedatwhichtheintrinsicelectronsbegintopredominate,whenitwillbegintofallexponentiallyinthemanneroncethoughttobecharacteristicifsemiconductors.

P1625、Whenlightfrequencyishighenoughsothataquantumabsorbedbyavalenceelectronhassufficientenergytoraiseitfromthetopofthefullbandtotheconductionband,extracarriersarecreatedandtheseleadtoincreasedconductivity.P1726、Itwillbeclearfromtheabovecalculationthatifgermaniumistobeintrinsicatroomtemperatureitmustbefreefromimpuritiesgivinglevelsneartheconductionbandtobetterthanonepartin109.

P1827、Itisanticipatedthatthereaderwillhavea"hands-on"involvementwithetchingandopticalmicroscopy,butitisexpectedthatwithX-raytopography,theappropriatespecialistwillperformtheworkandhelpinterprettheresults.

P1828、Itturnsout,however,thattheminoritycarriersarenevertheless,ofgreatimportance,asmanyelectronicprocessesinsemiconductortechnologyarecontrolledbytheminoritycarriers,thedensityofwhich,beingsmall,maybemorereadilyvaried.

P1829、Onetoonecorrelationsbetweendislocationsandemittertocollectorshortsinbipolartransistors,aswellasavalanchesitesinphotodetectorshavebeenmade,whereasprocessinducedstackingfaultsareknowntoreducethestoragetimeinMOSmemorydevices.P1930、Ifdefectcharacterizationisworthyofaphilosophy,thenitmustbe"donotuseoverkill",orinotherwordsusethesimplesttechniq

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