SFF简介及SFI电气参数测试课件

SFF简介及SFI电气参数测试SFF简介及SFI电气参数测试SFF简介及SFI电气参数测试AgendaIntroductionofSFF-8431SFF-8431StandardComplianceTestofSFIEyeDiagramTestbyDSA8200SFF简介及SFI电气参数测试SFF简介及SFI电气参数测试1AgendaIntroductionofSFF-8431SFF-8431StandardComplianceTestofSFIEyeDiagramTestbyDSA8200AgendaIntroductionofSFF-84312IntroductionofSFF-8431BRIEFINTRODUCTIONOFSFF-8431ThespecificationofSFF-8431definestheelectricalinterfacesandtheirtestmethodsbetweentheSFP+moduleandhostboardforoperationupto11.1GBd.ThehighspeedelectricalinterfacebetweenthehostandSFP+moduleiscalled“SFI”.SFIsimplifiesthemoduleandleverageshostbasedtransmitpre-emphasisandhostbasedreceiveequalizationtoovercomePCBandexternalmediaimpairments.SFItypicallyoperateswithoneconnectoratthemoduleinterfaceanduptoabout200mmofimprovedFR4materialor150mmofstandardFR4.Theelectricalinterfaceisbasedonhighspeed,lowvoltageACcoupledlogicwithanominaldifferentialimpedanceof100Ω.TheSFP+specificationsincludesmanagement,lowspeedsignal,highspeedsignal,connector(definedbySFF-8083),mechanical(definedbySFF-8432),andappendicesprovidingparameterandtestboarddefinitions,andimplementationandmeasurementdescriptions.IntroductionofSFF-8431BRIE3IntroductionofSFF-8431TheSFP+SUPPORTEDSTANDARDSIntroductionofSFF-8431The4IntroductionofSFF-8431POWERSPECIFICATIONSOFSFP+ThemodulesignalgroundcontactsVeeRandVeeTshouldbeisolatedfrommodulecase.AthostpowerupthehostshallsupplyVccTandVccRtothemodulewithin100msofeachother.SFP+lowspeedsignalingisbasedonLowVoltageTTL(LVTTL)operatingwithamodulesupplyof3.3V+/-5%andwithahostsupplyrangeof2.38to3.46V.Toavoidexceedingsystempowersupplylimitsandcoolingcapacity,allmodulesatpowerupbydefaultshalloperatewith≤1.0W.HostssupportingPowerLevelIIoperationmayenableaPowerLevelIImodulethroughthe2-wireinterface.PowerLevelIImodulesshallassertthepowerleveldeclarationbitofSFF-8472..Overlongspanssuchasthe40kmEthernetextendedreach(ER)longwavelengthapplications,theSFP+transceiversmayrequireadditionalpowerconsumption,especiallyatextremeoperatingconditions.•PowerLevelImodules–Upto1.0W•PowerLevelIImodules–Upto1.5WGENERALREQUIREMENTSIntroductionofSFF-8431POWE5IntroductionofSFF-8431Themaximumpowerlevelisallowedtoexceedtheclassifiedpowerlevelfor500msfollowinghotinsertionorpowerup,orPowerLevelIIauthorization,howeverthecurrentislimitedtovaluesgivenbythefollowingtable.POWERSPECIFICATIONSOFSFP+IntroductionofSFF-8431The6IntroductionofSFF-8431TheSFP+moduleshallmeetESDrequirementsgiveninEN61000-4-2,criterionBtestspecificationsuchthatunitsaresubjectedto15kVairdischargesduringoperationand8kVdirectcontactdischargestothecase.IntroductionofSFF-8431The7IntroductionofSFF-8431HIGHSPEEDELECTRICALSPECIFICATIONSofSFISFIsignalingisbasedondifferentialhighspeedlowvoltagelogicwithACcouplinginthemodule.SFIwasdevelopedwiththeprimarygoaloflowpowerandlowelectromagneticinterference(EMI).Tosatisfythisrequirementthenominaldifferentialsignallevelsare~500mVp-pwithedgespeedcontroltoreduceEMI.IntroductionofSFF-8431HIGH8IntroductionofSFF-8431PCBLAYOUTRECOMMENDATIONSThePCBtracesarerecommendedbythespecificationtomeet100±10Ωdifferentialimpedacewithnominal7%differentialcoupling.Itispreferabletohavetheimpedancetolerancebe±5Ω.Routedifferentialpairsatleast8xtheirtrace-widthfromothertraces.Avoidsharpanglesinrouting,chamfercorners.Inordertoavoidreflection,therecommendedminimumtracelengthrequirementis“1inch”inFR4.Whentheremustbeviasonthehigh-speeddifferentialsignals,the100differentialviasisrecommendedbeused.Andstubsduetoviasmustbeavoided.ThemaximumSFItracelengthrecommendbythespecificationofSFF-8431.IntroductionofSFF-84319SFF-8431StandardComplianceTestofSFITESTENVIRONMENTREQUIREMENTSThebandwidthofmeasurementinstrumentshallbe12GHzorabove;RequireACcoupledtestequipmentonalltestports；AllSFItestequipmentmusthave50ohmsingleendedimpedance；Referenceimpedancefordifferentialmeasurementsis100ohm,andthereferenceimpedanceforcommonmodemeasurementsis25ohm;Hostcompliancetestboardisrequired.SFF-8431STANDARDCOMPLIANCETESTofSFISFF-8431StandardComplianceT10TESTMETHODOLOGYANDMEASUREMENTHOSTCOMPLIANCETESTA.1TestpointHostsystemtransmitterandreceivercompliancearedefinedbytestsinwhichaHostComplianceBoardisinsertedinplaceoftheSFP+module.ThecompliancepointsareB.SFF-8431StandardComplianceTestofSFITESTMETHODOLOGYANDMEASUREME11A.2MeasurementsetupSFF-8431StandardComplianceTestofSFIA.2MeasurementsetupSFF-8412A.2TESTEQUIPMENTSFF-8431StandardComplianceTestofSFIA.2TESTEQUIPMENTSFF-843113A.3HostTransmitterOutputJitterandEyeMaskSpecificationsatBSFF-8431StandardComplianceTestofSFIA.3HostTransmitterOutput1410GSFP+CuDIRECTATTACHCABLEComplianceTest10GSFP+CucableassembliesareeffectivelyconstructedoutofapairofSFP+moduleswiththeOEcomponentsreplacedwithcoppercabling.ThecableassemblyshallincorporateDCblockingcapacitorswithatleast4.3VratingontheRXsideandwithhighpasspoleofbetween20kHzand100kHz.ThedrainwireisconnectedtoVeeTandtoVeeR.ThecableshielddirectlyconnectsthemoduleAandBcases.B.110GSFP+CuDirectAttachConstructionSFF-8431StandardComplianceTestofSFI10GSFP+CuDIRECTATTACHCABLE15SFF-8431StandardComplianceTestofSFIB.2SFP+DirectAttachCableTestSetupSFF-8431StandardComplianceT16SFF-8431StandardComplianceTestofSFIB.310GSFP+CuCableAssemblySpecificationsatB’andC’SFF-8431StandardComplianceT17OurTestEnvironmentFigure1EyeDiagramTestbyDSA8200OurTestEnvironmentFigure1Ey18KeyfeaturesofTestInstrumentsDSA8200DigitalSerialAnalyzerDCto65GHzopticalbandwidth;DCto70+GHzelectricalbandwidth,withupto12.5GHztriggering.Bandwidthisdeterminedbythecapabilitiesoftheinstalledmodules;CR125AElectricalClockRecoveryinstrument100Mb/sto12.5Gb/scontinuousdataratecoverage;Single-endedordifferential50Ωdatainputs/outputs;DCcoupleddatathroughpath;Insertionloss:-2.6dBwhen12GHz80E04ElectricalSampleModuleSMARFcoaxialcablewithupto18Gbandwidthandtheinsertionlossis1.4dB/mwhen10GHz.EyeDiagramTestbyDSA8200KeyfeaturesofTestInstrume19InstallingTestEnvironmentCautionsDoNOTapplyasignaloutsidetheMaximumInputVoltageSwing;Alwaysuseawriststrapwhenmakingsignalconnections;Dischargetogroundanyelectrostaticchargethatmaybepresentonthecenterandouterconductorsofcablesbeforeattachingthecablestotheinstrument;Neverinstallorremovemoduleswhiletheinstrumentispoweredon;DoNOTtransportorshiptheinstrumentwithmodulesinstalled;Ifpossible,alwaysuseESDprotectionmodule(80E02)alongthetestpath,example,TDRtest;Alwaysdisablethe80E04’sTDRfunctionwhennotusetheTDRfunction.EyeDiagramTestbyDSA8200InstallingTestEnvironmentEye20C.1AcquaintedwithOurInstrumentDSA8200DigitalSerialAnalyzerEyeDiagramTestbyDSA8200C.1AcquaintedwithOurInstr21EyeDiagramTestbyDSA8200EyeDiagramTestbyDSA820022CR125AElectricalClockRecoveryinstrumentEyeDiagramTestbyDSA8200CR125AElectricalClockRecov2380E04ElectricalSamplingModulewithTDRfunction.EyeDiagramTestbyDSA820080E04ElectricalSamplingModu24C.2EyeDiagramTestEnvironmentSetupofSFINotes：Pleaseseetheattachednotestosettheeyediagramtestsetup.Step1.Installingthehardwareenvironmentas“figure1”showing;EyeDiagramTestbyDSA8200Step2.POWERONtheinstrumentsandwait20minutesforinstrumentswarm-upperiod;C.2EyeDiagramTestEnvironm25EyeDiagramTestbyDSA8200Step3.ConfirmtheTDRfunctionisDISABLEDduringtheeyediagramtesttoavoiddamagethe80E04TDRmodule;Notes:Confirmthosecheck-boxunder“TDR”SETUPSisuncheckedtodisabletheTDRfunctionsonthetestchannel.EyeDiagramTestbyDSA8200Ste26EyeDiagramTestbyDSA8200Step4.ExecutecompensationandwaituntilthestatusofallitemswarmuptoPASS;IfthestatusisFail,rerunthecompensation.IfFailstatuscontinuesandyouhaveallowedwarmuptooccur,themoduleormaininstrumentmayneedservice.EyeDiagramTestbyDSA8200Ste27Step5.Settingsoftwareenvironment;SettingtheDisplayStyleNotes:SelecttheInfinitePersistenceonthe“Disp”andthe“fastsampling”modeonthefrontpanel.EyeDiagramTestbyDSA8200Step5.Settingsoftwareenvi28SettingtriggerNotes:SelecttheExternalPrescalerasthetriggersource.EyeDiagramTestbyDSA8200SettingtriggerEyeDiagramTes29SettingMathassourcesEyeDiagramTestbyDSA8200Notes：Fordifferentialsignaleyetest,subtractthetwodifferentialsourcesweusingtodefineamathastheaimedsignalsource.SettingMathassourcesEyeDia30WaveformDatabasesEyeDiagramTestbyDSA8200Notes：Selectthemathwehaddefinedasthewaveformdatabaseandchoosetheinfinitemodetodisplayit.WaveformDatabasesEyeDiagram31MaskSettingEyeDiagramTestbyDSA8200Notes：Selectouraimedeyemaskinthedrop-downmenuorimportcustomermaskwehaddefined.MaskSettingEyeDiagramTestb32SettingMeasurementsEyeDiagramTestbyDSA8200Notes：Selectthesignalsourceandsetsignaltypeto“NRZ”.Then,setmeasurementweaimedtoshowonthescreen,forexample,eyeheight,eyewidth,Pk-Pkjitter,RMSjitter,andsoon.SettingMeasurementsEyeDiagr33SetaSTOPActionEyeDiagramTestbyDSA8200SetaSTOPActionEyeDiagramT34RestartTestingEyeDiagramTestbyDSA8200RestartTestingEyeDiagramTes35EyeDiagramTestbyDSA8200Step3：CalibrateourtestinstallingThepropagationdelayinherentinconnectingcablesandprobescanresultininaccurateamplitudeandtime-correlatedmeasurements..Toobtainthebestmeasurementandanalysisresultsfromyourinstrument,youwillneedtoremoveskewandcompensatetheattenuationsinthetestenvironment.QuickTipsMinimizeskewbyusingbalancedcablepairs.Measureandmatchyourcables.TDRmodulessuchas80E04allowyoutomeasurecabledelayswithveryhighprecision.Compensatetheattenuationsonthecablesandperipherals(CR125A).EyeDiagramTestbyDSA8200Ste36EyeDiagramTestbyDSA8200De-skewCableDelayProcedureEyeDiagramTestbyDSA8200De-37EyeDiagramTestbyDSA8200EyeDiagramTestbyDSA820038EyeDiagramTestbyDSA8200EyeDiagramTestbyDSA820039EyeDiagramTestbyDSA8200EyeDiagramTestbyDSA820040EyeDiagramTestbyDSA8200Congratulations,that’salltheinstallingofourtestproceduresblow,andyoucanbeginyourtestnow!!!CompensatetheAttenuationonthesignalpathForexample,thenominalattenuationontheCR125Ais-2.6dBandthecoaxialcableis-0.7dB/m,weusedonetwo0.5mcoaxialcableeachchannel,so,weshouldcompensate4.0dB/channelonourdifferentialsignalpath.Notes：Usetheverticalbuttonstocompensatethechannelweused.EyeDiagramTestbyDSA8200Con41Q&AQ&A42Thankyou!Thankyou!43谢谢！谢谢！44SFF简介及SFI电气参数测试SFF简介及SFI电气参数测试SFF简介及SFI电气参数测试AgendaIntroductionofSFF-8431SFF-8431StandardComplianceTestofSFIEyeDiagramTestbyDSA8200SFF简介及SFI电气参数测试SFF简介及SFI电气参数测试45AgendaIntroductionofSFF-8431SFF-8431StandardComplianceTestofSFIEyeDiagramTestbyDSA8200AgendaIntroductionofSFF-843146IntroductionofSFF-8431BRIEFINTRODUCTIONOFSFF-8431ThespecificationofSFF-8431definestheelectricalinterfacesandtheirtestmethodsbetweentheSFP+moduleandhostboardforoperationupto11.1GBd.ThehighspeedelectricalinterfacebetweenthehostandSFP+moduleiscalled“SFI”.SFIsimplifiesthemoduleandleverageshostbasedtransmitpre-emphasisandhostbasedreceiveequalizationtoovercomePCBandexternalmediaimpairments.SFItypicallyoperateswithoneconnectoratthemoduleinterfaceanduptoabout200mmofimprovedFR4materialor150mmofstandardFR4.Theelectricalinterfaceisbasedonhighspeed,lowvoltageACcoupledlogicwithanominaldifferentialimpedanceof100Ω.TheSFP+specificationsincludesmanagement,lowspeedsignal,highspeedsignal,connector(definedbySFF-8083),mechanical(definedbySFF-8432),andappendicesprovidingparameterandtestboarddefinitions,andimplementationandmeasurementdescriptions.IntroductionofSFF-8431BRIE47IntroductionofSFF-8431TheSFP+SUPPORTEDSTANDARDSIntroductionofSFF-8431The48IntroductionofSFF-8431POWERSPECIFICATIONSOFSFP+ThemodulesignalgroundcontactsVeeRandVeeTshouldbeisolatedfrommodulecase.AthostpowerupthehostshallsupplyVccTandVccRtothemodulewithin100msofeachother.SFP+lowspeedsignalingisbasedonLowVoltageTTL(LVTTL)operatingwithamodulesupplyof3.3V+/-5%andwithahostsupplyrangeof2.38to3.46V.Toavoidexceedingsystempowersupplylimitsandcoolingcapacity,allmodulesatpowerupbydefaultshalloperatewith≤1.0W.HostssupportingPowerLevelIIoperationmayenableaPowerLevelIImodulethroughthe2-wireinterface.PowerLevelIImodulesshallassertthepowerleveldeclarationbitofSFF-8472..Overlongspanssuchasthe40kmEthernetextendedreach(ER)longwavelengthapplications,theSFP+transceiversmayrequireadditionalpowerconsumption,especiallyatextremeoperatingconditions.•PowerLevelImodules–Upto1.0W•PowerLevelIImodules–Upto1.5WGENERALREQUIREMENTSIntroductionofSFF-8431POWE49IntroductionofSFF-8431Themaximumpowerlevelisallowedtoexceedtheclassifiedpowerlevelfor500msfollowinghotinsertionorpowerup,orPowerLevelIIauthorization,howeverthecurrentislimitedtovaluesgivenbythefollowingtable.POWERSPECIFICATIONSOFSFP+IntroductionofSFF-8431The50IntroductionofSFF-8431TheSFP+moduleshallmeetESDrequirementsgiveninEN61000-4-2,criterionBtestspecificationsuchthatunitsaresubjectedto15kVairdischargesduringoperationand8kVdirectcontactdischargestothecase.IntroductionofSFF-8431The51IntroductionofSFF-8431HIGHSPEEDELECTRICALSPECIFICATIONSofSFISFIsignalingisbasedondifferentialhighspeedlowvoltagelogicwithACcouplinginthemodule.SFIwasdevelopedwiththeprimarygoaloflowpowerandlowelectromagneticinterference(EMI).Tosatisfythisrequirementthenominaldifferentialsignallevelsare~500mVp-pwithedgespeedcontroltoreduceEMI.IntroductionofSFF-8431HIGH52IntroductionofSFF-8431PCBLAYOUTRECOMMENDATIONSThePCBtracesarerecommendedbythespecificationtomeet100±10Ωdifferentialimpedacewithnominal7%differentialcoupling.Itispreferabletohavetheimpedancetolerancebe±5Ω.Routedifferentialpairsatleast8xtheirtrace-widthfromothertraces.Avoidsharpanglesinrouting,chamfercorners.Inordertoavoidreflection,therecommendedminimumtracelengthrequirementis“1inch”inFR4.Whentheremustbeviasonthehigh-speeddifferentialsignals,the100differentialviasisrecommendedbeused.Andstubsduetoviasmustbeavoided.ThemaximumSFItracelengthrecommendbythespecificationofSFF-8431.IntroductionofSFF-843153SFF-8431StandardComplianceTestofSFITESTENVIRONMENTREQUIREMENTSThebandwidthofmeasurementinstrumentshallbe12GHzorabove;RequireACcoupledtestequipmentonalltestports；AllSFItestequipmentmusthave50ohmsingleendedimpedance；Referenceimpedancefordifferentialmeasurementsis100ohm,andthereferenceimpedanceforcommonmodemeasurementsis25ohm;Hostcompliancetestboardisrequired.SFF-8431STANDARDCOMPLIANCETESTofSFISFF-8431StandardComplianceT54TESTMETHODOLOGYANDMEASUREMENTHOSTCOMPLIANCETESTA.1TestpointHostsystemtransmitterandreceivercompliancearedefinedbytestsinwhichaHostComplianceBoardisinsertedinplaceoftheSFP+module.ThecompliancepointsareB.SFF-8431StandardComplianceTestofSFITESTMETHODOLOGYANDMEASUREME55A.2MeasurementsetupSFF-8431StandardComplianceTestofSFIA.2MeasurementsetupSFF-8456A.2TESTEQUIPMENTSFF-8431StandardComplianceTestofSFIA.2TESTEQUIPMENTSFF-843157A.3HostTransmitterOutputJitterandEyeMaskSpecificationsatBSFF-8431StandardComplianceTestofSFIA.3HostTransmitterOutput5810GSFP+CuDIRECTATTACHCABLEComplianceTest10GSFP+CucableassembliesareeffectivelyconstructedoutofapairofSFP+moduleswiththeOEcomponentsreplacedwithcoppercabling.ThecableassemblyshallincorporateDCblockingcapacitorswithatleast4.3VratingontheRXsideandwithhighpasspoleofbetween20kHzand100kHz.ThedrainwireisconnectedtoVeeTandtoVeeR.ThecableshielddirectlyconnectsthemoduleAandBcases.B.110GSFP+CuDirectAttachConstructionSFF-8431StandardComplianceTestofSFI10GSFP+CuDIRECTATTACHCABLE59SFF-8431StandardComplianceTestofSFIB.2SFP+DirectAttachCableTestSetupSFF-8431StandardComplianceT60SFF-8431StandardComplianceTestofSFIB.310GSFP+CuCableAssemblySpecificationsatB’andC’SFF-8431StandardComplianceT61OurTestEnvironmentFigure1EyeDiagramTestbyDSA8200OurTestEnvironmentFigure1Ey62KeyfeaturesofTestInstrumentsDSA8200DigitalSerialAnalyzerDCto65GHzopticalbandwidth;DCto70+GHzelectricalbandwidth,withupto12.5GHztriggering.Bandwidthisdeterminedbythecapabilitiesoftheinstalledmodules;CR125AElectricalClockRecoveryinstrument100Mb/sto12.5Gb/scontinuousdataratecoverage;Single-endedordifferential50Ωdatainputs/outputs;DCcoupleddatathroughpath;Insertionloss:-2.6dBwhen12GHz80E04ElectricalSampleModuleSMARFcoaxialcablewithupto18Gbandwidthandtheinsertionlossis1.4dB/mwhen10GHz.EyeDiagramTestbyDSA8200KeyfeaturesofTestInstrume63InstallingTestEnvironmentCautionsDoNOTapplyasignaloutsidetheMaximumInputVoltageSwing;Alwaysuseawriststrapwhenmakingsignalconnections;Dischargetogroundanyelectrostaticchargethatmaybepresentonthecenterandouterconductorsofcablesbeforeattachingthecablestotheinstrument;Neverinstallorremovemoduleswhiletheinstrumentispoweredon;DoNOTtransportorshiptheinstrumentwithmodulesinstalled;Ifpossible,alwaysuseESDprotectionmodule(80E02)alongthetestpath,example,TDRtest;Alwaysdisablethe80E04’sTDRfunctionwhennotusetheTDRfunction.EyeDiagramTestbyDSA8200InstallingTestEnvironmentEye64C.1AcquaintedwithOurInstrumentDSA8200DigitalSerialAnalyzerEyeDiagramTestbyDSA8200C.1AcquaintedwithOurInstr65EyeDiagramTestbyDSA8200EyeDiagramTestbyDSA820066CR125AElectricalClockRecoveryinstrumentEyeDiagramTestbyDSA8200CR125AElectricalClockRecov6780E04ElectricalSamplingModulewithTDRfunction.EyeDiagramTestbyDSA820080E04ElectricalSamplingModu68C.2EyeDiagramTestEnvironmentSetupofSFINotes：Pleaseseetheattachednotestosettheeyediagramtestsetup.Step1.Installingthehardwareenvironmentas“figure1”showing;EyeDiagramTestbyDSA8200Step2.POWERONtheinstrumentsandwait20minutesforinstrumentswarm-upperiod;C.2EyeDiagramTestEnvironm69EyeDiagramTestbyDSA8200Step3.ConfirmtheTDRfunctionisDISABLEDduringtheeyediagramtesttoavoiddamagethe80E04TDRmodule;Notes:Confirmthosecheck-boxunder“TDR”SETUPSisuncheckedtodisabletheTDRfunctionsonthetestchannel.EyeDiagramTestbyDSA8200Ste70EyeDiagramTestbyDSA8200Step4.ExecutecompensationandwaituntilthestatusofallitemswarmuptoPASS;IfthestatusisFail,rerunthecompensation.IfFailstatuscontinuesandyouhaveallowedwarmuptooccur,themoduleormaininstrumentmayneedservice.EyeDiagramTestbyDSA8200Ste71Step5.Settingsoftwareenvironment;SettingtheDisplayStyleNotes:SelecttheInfinitePersistenceonthe“Disp”andthe“fastsampling”modeonthefrontpanel.EyeDiagramTestbyDSA8200Step5.Settingsoftwareenvi72SettingtriggerNotes:SelecttheExternalPrescalerasthetriggersource.EyeDiagramTestbyDSA8200SettingtriggerEyeDiagramTes73SettingMathassourcesEyeDiagramTestbyDSA8200Notes：Fordifferentialsignaleyetest,subtractt