化学检测相关中英文对照

1、TEM: Subject index10 / 10文档可自由编辑打印Aberration像差chromatic色差spherical球差astigmatic像散Absorption coefficient吸收系数abnormal反常吸收系数uniform均匀吸收系数Aperture光阑objective aperture物镜光阑selective area aperture选区光阑condenser lens aperture聚光镜光阑size光阑尺寸Astigmatism像散Anomalous absorption coefficient反常吸收系数Alignment of electron

2、 microscope电子显微镜的对准Antiphase domains反相畴Antiphase domain boundaries反相畴界Artefacts in specimens样品中的人为缺陷Atomic scattering amplitude原子散射振幅Back focal plane后焦面Beam current density束流密度Beam direction电子束方向Bend contours弯曲条纹Bend center弯曲中心Bend extinction contours弯曲消光条纹Bright field明场Bright field image明场像Burgers

3、vector determinations柏氏矢量确定Calibration of electron microscope电子显微镜的校准Camera constant相机常数Camera length相机长度Cavities空洞Characteristic images from a perfect crystal完整晶体特征图像thickness fringes厚度消光条纹bend extinction contours弯曲消光条纹bend contours弯曲条纹bend center弯曲中心Chemical polishing for specimen preparation试样的化学

4、抛光Chromatic abberation色差Coherency of precipitates沉淀相的共格性Coherency strain contrast共格应变衬度Column approximation晶柱近似Condenser lens聚光镜Constrained strain约束应变Dark field暗场Dark-field images暗场像Defocus欠焦Deformation of specimen试样变形Depth of field景深Depth of focus焦深Deviation parameter偏移参量effective value of有效偏移参量Dif

5、fraction contrast 衍射衬度Diffraction function衍射函数Diffraction mode衍射模式Diffraction pattern 衍射花样Diffraction theory衍射理论Direct lattice images直接点阵像Dislocations位错contrast from 位错衬度density of位错密度determination of Burgers vector of位错柏氏矢量的确定displacement fields around围绕位错的位移场nodes位错结perfect (whole)完全位错partial不全位错D

6、isplacement fringe contrast from precipitates 沉淀相粒子的位移条纹衬度Domain boundaries畴界Double condenser lens双聚焦透镜Double diffraction双衍射Dynamical theory of electron diffraction电子衍射的动力学理论Edwald sphere厄瓦尔德球Effective value有效(值)deviation parameter有效偏移参量extinction distance有效消光距离Electron beam电子束transmitted透射(电子)束diff

7、racted衍射(电子)束Electron diffraction电子衍射Electron diffraction patterns电子衍射花样accuracy of电子衍射花样的精度calibration of电子衍射花样的校准effects of crystal shape电子衍射花样的形状效应indexing of电子衍射花样的标定Kikuchi lines菊池线花样polycrystalline ring多晶环状衍射花样single crystal spot单晶斑点衍射衍射streaks on电子衍射花样的芒线Electron gun电子枪Electron microscope电子显微

8、镜analytical分析电镜attachments for电子显微镜的附件high resolution高分辩电镜magnification of电子显微镜的放大倍数ray diagrams for电子显微镜的光路图resolving power of电子显微镜的分辩力transmission 透射电镜Electron microscopy电子显微学(术)analytical分析电子显微学(术)conventional常规电子显微学high resolution高分辩电子显微学(术)transmission透射电子显微学Electron wavelengths电子波长Electropolis

9、hing for specimen preparation电解抛光制备电镜试样Extinction消光Extinction contours 消光条纹Extinction distance消光距离Extrinsic插入型的Faults 缺陷Focus distance焦距Foil thickness薄膜厚度measurement of膜厚测量Fringes条纹displacement位移条纹magnetic domain wall 磁畴壁条纹moire Moirre条纹precipitates, from由沉淀相粒子引起的 条纹stacking fault层错条纹thickness厚度条纹Go

10、niometer stage测角台Heating stages加热台High order Laue Zone高阶劳厄区High resolution electron microscopy 高分辩电镜Identification of precipitates沉淀相鉴别Illumination of specimen试样照明contamination by试样照明引起的污染damage by试样照明引起的破坏Image图像bright field明场像dark field暗场像intermediate中间像rotation of像转Image contrast图像衬度origin of图像衬度

11、的来源antiphase domains, from反相畴图像衬度antiphase domain boundaries, from反相畴界图像衬度cavities, from空洞图像衬度dislocations, from, 位错的衬度dipoles位错偶极子的衬度double images位错双线衬度edges刃型位错衬度general dislocation一般位错的衬度inclined倾斜位错的衬度invisibility criteria for位错不可见位错loops位错圈的衬度oscillation effects at位错衬度的振荡效应partial 不全位错的衬度screws

12、螺型位错的衬度superdislocations超位错的衬度surface relaxation effects位错衬度的表面松弛效应visibility rules for位错不可见规律width of images位错图像宽度partial dislocations不全位错的衬度FrankFrank位错的衬度SchockleySchockley位错的衬度precipitates,from, 沉淀相粒子的衬度coherency strain field images沉淀相粒子的共格应变场衬度dislocation ring contrast沉淀相粒子的位错圈衬度displacement fr

13、inge contrast沉淀相粒子的位移条纹衬度matrix contrast沉淀相粒子的基体衬度moire fringes沉淀相粒子的Morrie条纹衬度orientation contrast沉淀相粒子的取向衬度structure factor contrast沉淀相粒子的结构因子衬度visibility of沉淀相粒子的可见性stacking faults, from, 层错引起的衬度determination of nature of 层错性质的确定twin boundaries, from孪晶界的衬度Image force镜像力Image formation图像形成(成像)Abby

14、s theory ofAbby成像理论Image function像函数Image mode图像模式Image plane像平面Image rotation像转Inclusions 夹杂Indexing of electron patterns电子衍射花样标定trier and error尝试校核法known camera constant已知相机长度standard diffraction patterns标准衍射谱法computer simulation计算机标定法ambiguous 不唯一性Inelastic scattering非弹性散射Interface contrast界面衬度In

15、termediate image中间像Intermediate image plane中间像平面Intrinsic抽出型的Ion bombardment technique for specimen preparation离子束轰击制样法Kikuchi pattern菊池线花样Kikuchi lines菊池线Kikuchi maps菊池线图Kinematical theory of diffraction contrast运动学衍衬理论Lattice image 点阵像two beam双束点阵(平面)像many beam 多束点阵像structure image结构像Lattice plane

16、 spacing点阵面间距Laue circle劳厄园Laue zones劳厄区high order高阶劳厄区Line defect线缺陷Line of no contrast无衬度线Magnetic lens电磁透镜aberrations of电磁透镜的像差focal length of电磁透镜的焦距pole-piece of电磁透镜的极靴Many-beam effects多束效应Measurements of; dislocation density, 位错密度测量elastic strain fields of precipitates沉淀相粒子弹性应变场测量foil thickness

17、膜厚测量precipitate size,沉淀相粒子尺寸测量stacking fault energy层错能测量nodes, by用位错结测量层错能 ribbon widths, by用层错带宽度测量层错能Microanalysis微区分析Moire patternsMoire花样from precipitates沉淀相粒子Moire花样mixed混合Moire条纹parallel平行Moire条纹rotation旋转Moire条纹spacing ofMoire条纹间距Nodes, extended threefold, 三维扩展位错结stacking fault energy from三维扩

18、展位错结测量层错能Objective wave function物波函数Objective lens物镜Operating vector操作矢量Operation reflection操作反射Orientation determination取向确定Orientation relationship取向关系Parallel moire patterns平行Moire条纹Partial dislocations, contrast from 平行位错的衬度determination of Burgers vectors of位错柏氏矢量的确定FrankFrank位错柏氏矢量确定ShockleySh

19、ockley位错柏氏矢量确定Particles粒子Planar defect面缺陷Point defects in specimen试样中的点缺陷Pole-piece of magnetic lens电磁透镜极靴Precipitates沉淀相粒子contrast from沉淀相粒子衬度size of沉淀相粒子尺寸visibility of沉淀相粒子可见性Precipitation contrast沉淀相衬度Projective lens投影镜Reciprocal lattice倒易点阵construction倒易点阵的构筑definition of倒易点阵的定义properties of倒易点

20、阵的性质Replica复型Resolution分辩率Ring diffraction patterns环状衍射花样Rotation moirre patterns旋转Moirre花样Satellites on electron diffraction patterns衍射花样卫星斑点Scattering amplitude 散射振幅Scattering of electrons电子散射Second phase particles第二相粒子Selected area diffraction选区电子衍射accuracy of选区电子衍射的精度Shape effect形状效应Single cryst

21、al diffraction patterns单晶电子衍射花样Specimen试样contamination of试样污染cooling of试样冷却deformation of试样变形heating of试样加热microanalysis of试样微区分析orientation of试样的取向preparation of试样制备chemical machining试样加工chemical polishing, by用化学抛光制备试样ion bombardment, by离子轰击制备试样electropolishing电解抛光制备试样jet machining, by, 电解双喷制样法Spec

22、imen holder试样台top enrty顶插式试样台side entry侧插式试样台Spherical aberration 球差Spinodal decomposition拐点分解Stacking faults层错contrast of 层错的衬度determination of nature of确定层错的性质energy of层错能types of层错类型Sterogram极图Stereomicroseopy体视显微术Stigmator消像散器Strainfields 应变场Streaks on electron diffraction patterns衍射花样的星芒线Struct

23、ure factor结构因子contrast from, 结构因子衬度Subsidiary fringe副条纹Superlattice超点阵reflections超点阵反射Theory of diffraction contrast衍射衬度理论kinematic运动学衍衬理论dynamic动力学衍衬理论Two beam approximation双束近似Uniform absorption coefficient反常吸收系数Viewing screen荧光屏Weak beam technique弱束技术Weak beam dark field image弱束暗场象Zone晶带Zone law晶

24、带定理Zone axis晶带轴Zone axis patterns晶带轴花样HREMAiry discAiry园(盘)Amplitude object振幅物Amplitude contrast振幅衬度Astigmatism像散Astigmator消像散器Axial轴向照明Axial alignment合轴调整Chromatic aberration coefficient色差系数Chromatic aberration色差Chromatic aberration limited resolution色差限制的分辩率Cluster偏聚区Coherence相干性Defocus欠焦Diffracti

25、on contrast衍射衬度Diffraction limit衍射极限Diffraction limited resolution衍射限制的分辩率Diffused circle弥散园Exact focus准确聚焦Experimental condition实验条件Exsolution脱溶Focus聚焦, 焦距, 焦点Focal length焦距Frensnel fringes菲捏尔条纹Grain boundaries晶界small angle小角度晶界high angle大角度晶界symmetrical对称晶界asymmetrical不对称晶界tilt倾斜晶界Guinier-Preston

26、zonesGP区HREM images高分辩电镜图像interpretation高分辩电镜图像的解释information available高分辩电镜图像的信息image analysis of图像分析computer simulation of计算机模拟Illumination照明axial轴向照明tilted倾斜照明Illumination semi-angle照明半角Image analysis图像分析Imaging mode图像模式lattice plane点阵平面像many beam多束点阵像structure结构像Image restoration图像修复Incident wav

27、e入射波Interaction constant交互作用常数Interplanar spacing面间距Internal standards内标Line to line resolution线分辩率Multi-slice approximation多片近似Optical diffraction光学衍射Optimum defocus最佳欠焦(量)Optimum resolution最佳分辩率Optimum illumination semi-angle 最佳照明半角Optimum aperture size最佳光阑尺寸Order/disorder transition有序/无序转变Orienta

28、tion取向BraggBragg取向LaueLaue取向Over focus过焦Phase change相位变化induced by defocus欠焦引起的相位变化by spherical aberration球差引起的相位变化Phase contrast相位衬度Phase contrast transfer function相位衬度传递函数Phase grating相位光栅Phase grating approximation相位光栅近似Phase object相位物Phase object approximation相位物近似Phase shift相位变化Phase transition

29、相转变Phase transformation相变Point source点源Point to point点分辩率Projected potential投影势Propagation function传递函数Polymorphism多型性(转变)Resolution分辩率line to line线分辩率point to point点分辩率Resolution limit分辩率极限Scattered wave散射波Spherical aberration球差Spherical aberration coefficient球差系数(CS)Spherical aberration limited re

30、solution球差限制的分辩率Tilted illumination倾斜照明Through focus series聚焦系列Two beam lattice plane imaging双束点阵平面像Two beam lattice fringe imaging双束点阵条纹像Weak phase approximation弱相位近似AEMAamorphous carbon 非晶碳EELS absolute quantification用于EELS绝对定量analytical electron microscope 分析电镜alignment对中calibration for EELS or E

31、DSEELS或EDS定标analytical electron microscopy分析电子显微学annular dark-field imaging 环状暗场像annular detector环状探头apertures 光阑2nd condenser lens (C2) 第二聚光镜光阑effect on microanalysis对微区分析的影响effect on microdiffraction对微束衍射的影响effect on probe convergence对探针会聚性的影响objective物镜光阑selected area (SA) 选区光阑ultra-thick超厚光阑Auge

32、r electrons俄歇electron spectroscopy俄歇谱Bbackground spectrum本底(背底)谱in EELSEELS背底谱subtraction in EDS扣除EDS谱背底subtraction in EELS扣除EDS谱背底X-rays扣除X-射线背底(请参见 bremsstrahlung 和 continuum)backscattered electrons背散射电子detector背散射电子探头images背散射电子像beam电子束beam damage电子束损伤beam-sensitive specimens电子束敏感试样beam-specimen

33、interactions电子束-试样交互作用beam spreading电子束扩展beryllium window铍窗bremsstrahlung X-rays背底辐射X-射线bright field detector明场探头bright field image in STEMSTEM 明场像brightness of electron source电子源亮度Ccalibration校准, 定标cathode ray tube阴极射线管cathodoluminescence阴极荧光(辐射)Cliff-Lorimer equationCliff-Lorimer 公式condenser lens

34、first (C1) 第一聚光镜condenser lens second (C2) 第二聚光镜condenser objective lens聚光镜物镜contamination污染use to determine thickness用于厚度测定continuum X-rays连续(背底)X-射线convergent beam diffraction 会聚束衍射use to determine thickness用于厚度测定convergent beam diffraction patterns (CBDP)会聚束衍射花样convergent electron probe会聚电子探针crys

35、tal point group (晶体)点群Ddark field detector 暗场探头dark field image in STEMSTEM暗场像deconvolution解谱, EDS或EELSof EDS spectrum, of EELS spectrumdiad symmetry二次对称diffraction groups 衍射群diffraction maxima衍射极大值EEDS (Energy Dispersive Spectroscopy) 能谱(能量色散谱)EDS defector 能谱探头EELS spectrometer电子能量损失谱仪EELS 电子能量损失谱(

36、electron energy loss spectrum)zero loss peak零损失峰plasmon peak 等离子振荡峰energy loss peaks能量损失峰ionization edge电离损失峰(边)background subtraction背底扣除elastic scatter弹性散射electron detectors电子探头collection angle收集角electron energy loss spectrometer电子能量损失谱仪electron energy loss spectrometry电子能量损失谱energy loss processes

37、电子能量损失过程imaging/mapping电子能量损失成象ionization losses电离损失limitations极限plasmon losses等离子振荡损失spatial resolution空间分辨率electron-hole pairs电子-空位对electron probe电子探针brightness亮度convergence angle会聚角current电流diameter直径energy dispersive spectrometer能谱仪 (See X-ray energy dispersive58 spectrometer)energy filtered ima

38、ges能量过滤图像extended absorption fine structure广延吸收精细结构extraction replica萃取复型Ffirst order laue zone (FOLZ)一阶劳厄区fine structure in ionization edge电离峰(边)精细结构post-edge (EXAFS)峰后(EXAFS)pre-edge峰前forbidden reflections禁止反射full width half maximum半高宽Gg vectorg矢量Gaussian高斯Hhard X-rays硬X-射线higher order laue zone (

39、HOLZ)高阶劳厄区indexing标定lines高阶劳厄区线reflections高阶劳厄区反射rings高阶劳厄区环HOLZ lines高阶劳厄区线Iillumination system照明系统imaging in STEMSTEM成像image enhancement图像增强Indexing标定HOLZ lines高阶劳厄区线HOLZ patterns高阶劳厄区花样ZOLZ patterns零阶劳厄区花样inelastic scatter非弹性散射(See also electron energy loss)effect on EDS对EDS的影响effect on EELS对EELS

40、的影响ionization电离ionization edges电离损失峰(边)post-edge fine structure峰后精细结构pre-edge fine structure峰前精细结构KKossel patterns (conditions)Kossel花样Kossel-Möllenstedt fringes use to determine thicknessK-M条纹9用于确定试样厚度)Kossel-Möllenstedt (K-M) patternsK-M花样Llanthanum hexaboride gun六硼化镧电子 枪lattice paramete

41、r determination点阵常数确定lattice strain点阵应变effect on HOLZ lines 对高阶劳厄区线的影响lenses透镜auxiliary辅助透镜condenser聚光镜condenser-objective聚光镜-物镜intermediate中间镜objective物镜projector投影镜light element analysis by EDSEDS轻元素分析by EELSEELS轻元素分析limitations to X-ray analysisX-射线分析极限low loss electrons低能量损失电子Mmicrodiffraction微束

42、衍射microprobe mode微区探针模式minimum detectable mass最小可探测质量minimum mass fraction最小质量分数N0objective aperture物镜光阑objective lens物镜Ppeak to background ratio峰/背比in EDS spectrumEDS谱in EELS spectrum EELS谱(See also signal to noise ratio)参见信/噪比phonon energy loss 声子能量损失plasmon energy losses等离子振荡能量损失probe convergence

43、 angle探针会聚角Qqualitative analysis定性分析using EDSEDS定性分析using EELSEELS定性分析quantitative analysis定量分析using EDSEDS定量分析using EELSEELS定量分析Rradial distribution function径向分布函数radiation damage辐射损伤resolution分辨率of EDS spectrometer EDS谱仪分辨率ot EELS spectrometer EELS谱仪分辨率of STEM imageSTEM图像分辨率Riecke microdiffractionRiecke法微束衍射Sscanning electron microscope 扫