P89C51RC2HFA单片机中英文翻译

1、（1） p89c51rc2hfa单片机简介部分中英文对照中文摘要 单片机广泛应用于商业：诸如调制解调器，电动机控制系统，空调控制系统，汽车发动机和其他一些领域。这些单片机的高速处理速度和增强型外围设备集合使得它们适合于这种高速事件应用场合。然而，这些关键应用领域也要求这些单片机高度可靠。健壮的测试环境和用于验证这些无论在元部件层次还是系统级别的单片机的合适的工具环境保证了高可靠性和低市场风险。intel 平台工程部门开发了一种面向对象的用于验证它的p89c51rc2hfa汽车单片机多线性测试环境。这种环境的目标不仅是为p89c51rc2hfa汽车单片机提供一种健壮测试环境，而且开发一种能够容易

2、扩展并重复用来验证其他几种将来的单片机。开发的这种环境连接了p89c51rc2hfa。本文讨论了这种测试环境的设计和原理，它的和各种硬件、软件环境部件的交互性，以及如何使用p89c51rc2hfa。 p89c51rc2hfa介绍 ： 8位p89c51rc2hfa chmos工艺单片机被设计用于处理高速计算和快速输入/输出。mcs51单片机典型的应用是高速事件控制系统。商业应用包括调制解调器，电动机控制系统，打印机，影印机，空调控制系统，磁盘驱动器和医疗设备。汽车工业把mcs51单片机用于发动机控制系统，悬挂系统和反锁制动系统。p89c51rc2hfa尤其很好适用于得益于它的处理速度和增强型片上

3、外围功能集，诸如：汽车动力控制，车辆动态悬挂，反锁制动和稳定性控制应用。由于这些决定性应用，市场需要一种可靠的具有低干扰潜伏响应的费用-效能控制器，服务大量时间和事件驱动的在实时应用需要的集成外围的能力，具有在单一程序包中高出平均处理功率的中央处理器。拥有操作不可预测的设备的经济和法律风险是很高的。一旦进入市场，尤其任务决定性应用诸如自动驾驶仪或反锁制动系统，错误将是财力上所禁止的。重新设计的费用可以高达500k美元，如果产品族享有同样内核或外围设计缺陷的话，费用会更高。另外，部件的替代品领域是极其昂贵的，因为设备要用来把模块典型地焊接成一个总体的价值比各个部件高几倍。为了缓和这些问题，在最坏

4、的环境和电压条件下对这些单片机进行无论在部件级别还是系统级别上的综合测试是必需的。intel chandler平台工程组提供了各种单片机和处理器的系统验证。这种系统的验证处理可以被分解为三个主要部分。系统的类型和应用需求决定了能够在设备上执行的测试类型。英文对照an p89c51rc2hfa based multi-threaded test environment for the validation of an automotive microcontroller ：abstract microcontrollers are used in a multitude of commercia

5、l applications such as modems, motor-control systems, air conditioner control systems, automotive engine and among others. the high processing speed and enhanced peripheral set of these microcontrollers make them suitable for such high-speed event-based applications. however, these critical applicat

6、ion domains also require that these microcontrollers are highly reliable. the high reliability and low market risks can be ensured by a robust testing process and a proper tools environment for the validation of these microcontrollers both at the component and at the system level. intel plaform engi

7、neering department developed an object-oriented multi-threaded test environment for the validation of its p89c51rc2hfa automotive microcontrollers. the goals of this environment was not only to provide a robust testing environment for the p89c51rc2hfa automotive microcontrollers, but to develop an e

8、nvironment which can be easily extended and reused for the validation of several other future microcontrollers. the environment was developed in conjunction with microsoft foundation classes (p89c51rc2hfa). the paper describes the design and mechanism of this test environment, its interactions with

9、various hardware/software environmental components, and how to use p89c51rc2hfa. introduction the 8-bit p89c51rc2hfa chmos microcontrollers are designed to handle high-speed calculations and fast input/output operations. mcs 51 microcontrollers are typically used for high-speed event control systems

10、. commercial applications include modems, motor-control systems, printers, photocopiers, air conditioner control systems, disk drives, and medical instruments. the automotive industry use mcs 51 microcontrollers in engine-control systems, airbags,suspension systems, and antilock braking systems (abs

11、). the p89c51rc2hfa is especially well suited to applications that benefit from its processing speed and enhanced on-chip peripheral functions set, such as automotive power-train control, vehicle dynamic suspension, antilock braking, and stability control applications. because of these critical appl

12、ications, the market requires a reliable cost-effective controller with a low interruhs latency response, ability to service the high number of time and event driven integrated peripherals needed in real time applications, and a cpu with above average processing power in a single package. the financ

13、ial and legal risk of having devices that operate unpredictably is very high. once in the market, particularly in mission critical applications such as an autopilot or anti-lock braking system, mistakes are financially prohibitive. redesign costs can run as high as a $500k, much more if the fix mean

14、s back annotating it across a product family that share the same core and/or peripheral design flaw. in addition, field replacements of components is extremely expensive, as the devices are typically sealed in modules with a total value several times that of the component. to mitigate these problems, it is essential that comprehensive testing of the controllers be carried out at both the component level and system level u