21th PA-Course 2010 -Day1译

1、Training ModuleDay 1General Phased Array Ultrasonic Technology通用相控阵技术Phased Array Techniques相控阵技术Phased Array Techniques相控阵技术Phased Array Techniques相控阵技术Phased Array Techniques相控阵技术Preferred Access Surface首选接触表面Seal-ring groove密封槽Corrosion starts here腐蚀区域Phased Array Techniques相控阵技术First signs of co

2、rrosion seen in this area可以发现腐蚀的区域Limited coverage due to bolt holes螺栓孔限制覆盖Phased Array Techniques相控阵技术Corrosion simulation targets模拟腐蚀Phased Array Techniques相控阵技术Polar Plot极面视图C-scanS-scanA-scanBlanks due to bolt holes螺栓孔造成的空白Area of corrosion腐蚀区域Nominal wall正常壁厚Maximum Wall Loss最大壁厚损失Phased Array

3、Techniques相控阵技术Analysis assisted by use of overlays使用覆盖图辅助分析数据Phased Array Techniques相控阵技术Analysis assisted by use of overlays (model with 3mm SDH and wall-loss region)使用覆盖图辅助分析数据（3mm SDH和壁厚损失区域）Phased Array Techniques相控阵技术Set-through (set-in) and Set-on插入式和马鞍式Phased Array Techniques相控阵技术Techniques

4、技术Depend on Access (ID or OD) 基于可接触面（ID或OD）Ideally both ID and OD scans are made 理想状态从ID和OD进行扫查Restrictions may limit one or other 可能会限制一种或其他(OD-nozzles or reinforcement pad)（OD接管或加强衬垫）(ID small diameter or internals)（ID小直径或内部）Preference given to scan from bevelled plate 从开坡口的工件侧进行扫查Phased Array Tec

5、hniques相控阵技术Phased Array Techniques相控阵技术0& 18090& 27015mm drop to nozzle edge楔块深入到接管边缘以下15mmPhased Array Techniques相控阵技术Phased Array Techniques相控阵技术Phased Array Techniques相控阵技术Merged C-scan with 0 and 10 compression mode merged0和10纵波合并的C-扫描Phased Array Techniques相控阵技术Merged C-scan with 15mm and 25mm

6、 offsets15mm和25mm偏移的合并C-扫描Phased Array Techniques相控阵技术Phased Array Techniques相控阵技术Phased Array Techniques相控阵技术Phased Array Techniques相控阵技术Phased Array Techniques相控阵技术http:/ Steeple Inspection转子塔尖检测Phased Array Techniques相控阵技术Phased Array Techniques相控阵技术Phased Array Techniques相控阵技术Coupling concerns考虑

7、耦合Smaller probes for smaller radius surfaces小探头用于小半径曲面Flat probe limit 0.5mm gap (EN 1714)平探头与工件表面间隙限制在0.5mm（EN 1714）Phased Array Techniques相控阵技术Scanning from Nozzle ID or OD makes a gap when using flat probes使用平探头从接管内壁或外壁扫查时产生间隙Phased Array Techniques相控阵技术Use the 0.5mm guide to scan a range of pipe

8、 diameters!扫查一定范围的管径，间隙在0.5mm之内Curved for 100mm diameter适用于100mm直径的楔块OK on 85mm diameter适用于85mm直径工件Not good on 75mm diameter不适用于75mm直径工件Phased Array Techniques相控阵技术Curving the probe elements to reduce length oversizing曲面探头减少长度方向定量的放大Length Size of a 1mm through hole on full skip in 70mm diameter pip

9、e采用全跨检测70mm直径管道，对1mm通孔进行长度定量Both use curved wedge but probe on right has curved elements.两种探头楔块均采用曲面楔块，但右侧采用曲面晶片4.2mm2.4mmPhased Array Techniques相控阵技术Multiple weld cross-sections mirrored at plate thickness多个焊缝截面覆盖图Flaw imaged on 1.5 skip section of sound-path1.5跨声程上发现的缺陷信号Typical Overlay Display As

10、sumes parallel surfaces典型的覆盖图显示假定为平行表面Phased Array Techniques相控阵技术Typical Overlay Plotting Results in Error on Curved Surface典型覆盖图在曲面工件产生的误差Beam plots flaw 19mm lower波束低于正确位置19mmFlaw缺陷 Phased Array Techniques相控阵技术Heavy nozzles too thick for a single probe position 7 merged S-scans used for upper hal

11、f of weld!厚壁接管-工件太厚，探头放在一个位置不能全部覆盖。7个合并的S-扫描用于检测焊缝上半部分。300mm500mmCylindrical corrected C-scan柱形校正的C-扫描Volume corrected Merged S-scans体积校正的合并S-扫描Phased Array Techniques相控阵技术Phased Array Techniques相控阵技术Phased Array Techniques相控阵技术Phased Array Techniques相控阵技术Spinning friction head means there is no pre

12、ferred flaw orientation旋转摩擦头意味着没有好的缺陷走向Phased Array Techniques相控阵技术Description of the phased array solution相控阵方案描述相控阵方案描述 One phased array probe straddling the weld for axial detection,plus a second and third phased array probe for transverse defect detection 一个相控阵探头跨在焊缝上用于轴向检测，再加上第二个和第三个相控阵探头用于横向缺陷

13、检测。 Inspection with 65 SW and 35 SW for axial defects 65横波和35横波用于轴向缺陷检测 Inspection with 45 SW refraction angle and skew angles of 30, 0,and 30 for transverse defects 45横波和30, 0和30偏转角度用于横向缺陷检测。 Electronic scanning of the beam for all configurations 所有结构均采用电子扫查 Full weld inspection performed in a line

14、ar scan (up to 20 meters) 一次线性扫查可以实现焊缝全覆盖（20m长） Coupling is performed with local immersion wedges 水浸式楔块提供耦合。Phased Array Techniques相控阵技术Description of the phased array solution相控阵方案描述相控阵方案描述Phased Array Techniques相控阵技术Stainless steel, Inconel, dis-simlar metals不锈钢、因康镍合金，异种金属不锈钢、因康镍合金，异种金属Noisy signa

15、ls from coarse-grain scattering is a UT problem that Phased-array also suffers (same as conventional UT)粗晶散射导致噪声信号高是超声相控阵检测面临的主要问题（常规超声也一粗晶散射导致噪声信号高是超声相控阵检测面临的主要问题（常规超声也一样）。样）。PA-allows a unique method of TRL and bi-modal signal collection that can improve results in SOME circumstances. 相控阵采用独有的相控阵采用独有的TRL技术和技术和Bi-模式信号采集方式，在某些情况下可以改善模式信号采集方式，在某些情况下可以改善检测结果。检测结果。Phased Array Techniques相控阵技术Stainless steel, Inconel, dis-simlar metals不锈钢 、因康镍合金、异种金属Alloy 625 (UNS N06625) is an austenitic nickel base superalloyUsed for cladding and filler625合金（UNS N06625）是一种奥氏体镍基合金，用于堆焊和填充Flaw se